Datasheet Si8931/32 (Silicon Labs) - 7

link to page 7 Si8931/32 Data Sheet Electrical Specifications
Parameter Symbol Test Condition Min Typ Max Units
PSRR vs. VDDA at DC –100 dB PSRR vs. VDDA at 100 mV –100 dB Power Supply and 10 kHz ripple PSRR Rejection Ratio PSRR vs. VDDB at DC –100 dB PSRR vs. VDDB at 100 mV –100 dB and 10 kHz ripple Between AON and AOP Output Resistive (Si8931) RLOAD 5 kΩ Load Between AO and GND (Si8932) Output Capacitive CLOAD Each pin to ground 100 pF Load
Timing
Signal Delay tPD 50% to 50% 1 µs Rise Time tR 10% to 90% 1.6 µs Common-Mode Transient VIN = GNDA, CMTI 50 75 kV/µs VCM = 1500 V Immunity1
Note:
1. An analog CMTI failure is defined as an output error of more than 100 mV persisting for at least 1 µs.
Figure 4.1. Common-Mode Transient Immunity Characterization Circuit silabs.com
| Building a more connected world. Preliminary Rev. 0.5 | 7 Document Outline 1. Ordering Guide 2. System Overview 3. Voltage Sense Application 4. Electrical Specifications 4.1 Regulatory Information 4.2 Typical Operating Characteristics 5. Pin Descriptions 5.1 Si8931 Pin Descriptions 5.2 Si8932 Pin Descriptions 6. Packaging 6.1 Package Outline: 8-Pin Wide Body Stretched SOIC 6.2 Package Outline: 8-Pin Narrow Body SOIC 6.3 Land Pattern: 8-Pin Wide Body Stretched SOIC 6.4 Land Pattern: 8-Pin Narrow Body SOIC 6.5 Top Marking: 8-Pin Wide Body Stretched SOIC 6.6 Top Marking: 8-Pin Narrow Body SOIC 7. Document Revision History