Datasheet ADG604 (Analog Devices) - 3

ADG604 SINGLE SUPPLY1 (VDD = 5 V 10%, VSS = 0 V, GND = 0 V. All specifications –40 C to +125 C unless otherwise noted.) –40 C to –40 C to Parameter 25 C +85 C +125 C Unit Test Conditions/Comments
ANALOG SWITCH Analog Signal Range 0 V to VDD V VDD = 4.5 V, VSS = 0 V On Resistance (RON) 210 Ω Typ VS = 3.5 V, IS = –1 mA, 290 350 380 Ω Max Test Circuit 1 On Resistance Match Between Channels (⌬RON) 3 Ω Typ VS = 3.5 V, IS = –1 mA 12 13 Ω Max LEAKAGE CURRENTS VDD = 5.5 V Source OFF Leakage IS (OFF) ±0.01 nA Typ VS = 1 V/4.5 V, VD = 4.5 V/1 V, ±0.1 ±0.25 ±4 nA Max Test Circuit 2 Drain OFF Leakage ID (OFF) ±0.01 nA Typ VS = 1 V/4.5 V, VD = 4.5 V/1 V, ±0.1 ±0.5 ±8 nA Max Test Circuit 2 Channel ON Leakage ID, IS (ON) ±0.01 nA Typ VS = VD = 4.5 V/1 V, ±0.1 ±0.5 10 nA Max Test Circuit 3 DIGITAL INPUTS Input High Voltage, VINH 2.4 V Min Input Low Voltage, VINL 0.8 V Max Input Current IINL or IINH 0.005 µA Typ VIN = VINL or VINH ±0.1 µA Max CIN, Digital Input Capacitance 2 pF Typ DYNAMIC CHARACTERISTICS Transition Time 90 ns Typ VS1 = 3 V, VS4 = 0 V, RL = 300 Ω, 150 185 210 ns Max CL = 35 pF, Test Circuit 4 tON Enable 105 ns Typ RL = 300 Ω, CL = 35 pF 150 190 220 ns Max VS = 3 V, Test Circuit 6 tOFF Enable 45 ns Typ RL = 300 Ω, CL = 35 pF 70 80 90 ns Max VS = 3 V, Test Circuit 6 Break-Before-Make Time Delay, tBBM 30 ns Typ RL = 300 Ω, CL = 35 pF, 10 ns Min VS1 = VS2 = 3 V, Test Circuit 5 Charge Injection 0.3 pC Typ VS = 0 V , RS = 0 Ω, CL = 1 nF, Test Circuit 7 Off Isolation –65 dB Typ RL = 50 Ω, CL = 5 pF, f = 10 MHz, Test Circuit 8 Channel-to-Channel Crosstalk –70 dB Typ RL = 50 Ω, CL = 5 pF, f = 10 MHz, Test Circuit 10 Bandwidth –3 dB 250 MHz Typ RL = 50 Ω, CL = 5 pF, Test Circuit 9 CS (OFF) 5 pF Typ f = 1 MHz CD (OFF) 17 pF Typ f = 1 MHz CD, CS (ON) 18 pF Typ f = 1 MHz POWER REQUIREMENTS VDD = 5.5 V Digital Inputs = 0 V or 5.5 V IDD 0.001 µA Typ 1.0 µA Max NOTES 1Y Version Temperature Range: –40°C to +125°C. Specifications subject to change without notice. REV. A –3–