Datasheet UT69RH051 (Aeroflex) - 10
| Fabricante | Aeroflex |
| Descripción | Radiation-Hardened MicroController |
| Páginas / Página | 20 / 10 — 6.0 AC CHARACTERISTICS READ CYCLE (Post-Radiation)*. SYMBOL. PARAMETER. … |
| Formato / tamaño de archivo | PDF / 1.0 Mb |
| Idioma del documento | Inglés |
6.0 AC CHARACTERISTICS READ CYCLE (Post-Radiation)*. SYMBOL. PARAMETER. MINIMUM. MAXIMUM. UNIT. Note:
Línea de modelo para esta hoja de datos
- 5962F9563801QQA 5962F9563801QQC 5962F9563801QQX 5962F9563801QYA 5962F9563801QYC 5962F9563801QYX 5962F9563801VQA 5962F9563801VQC 5962F9563801VQX 5962F9563801VYA 5962F9563801VYC 5962F9563801VYX 5962G9563801QQA 5962G9563801QQC 5962G9563801QQX 5962G9563801QYA 5962G9563801QYC 5962G9563801QYX 5962G9563801VQA 5962G9563801VQC 5962G9563801VQX 5962G9563801VYA 5962G9563801VYC 5962G9563801VYX 5962H9563801QQA 5962H9563801QQC 5962H9563801QQX 5962H9563801QYA 5962H9563801QYC 5962H9563801QYX 5962H9563801VQA 5962H9563801VQC 5962H9563801VQX 5962H9563801VYA 5962H9563801VYC 5962H9563801VYX 5962R9563801QQA 5962R9563801QQC 5962R9563801QQX 5962R9563801QYA 5962R9563801QYC 5962R9563801QYX 5962R9563801VQA 5962R9563801VQC 5962R9563801VQX 5962R9563801VYA 5962R9563801VYC 5962R9563801VYX UT69RH051P-CA UT69RH051P-CC UT69RH051P-CX UT69RH051W-PA UT69RH051W-PC UT69RH051W-PX
Versión de texto del documento
6.0 AC CHARACTERISTICS READ CYCLE (Post-Radiation)*
(VDD = 5.0V ±10%; -55°C < TC < +125°C)
SYMBOL PARAMETER MINIMUM MAXIMUM UNIT
tCLCL Clock Period 50 ns 1/tCLCL Oscillator Frequency 20 MHz tLHLL ALE Pulse Width 2 tCLCL-40 ns tAVLL Address Valid to ALE Low tCLCL-40 ns t 1 Address Hold after ALE Low t LLAX CLCL-30 ns tLLIV ALE Low to Valid Instruction 4 tCLCL-100 ns tLLPL ALE Low to PSEN Low tCLCL-30 ns tPLPH PSEN Pulse Width 3 tCLCL-45 ns tPLIV PSEN Low to Valid Instruction In 3 tCLCL-105 ns t 1 Input Instruction Hold after PSEN 0 ns PXIX t 1 Input Instruction Float after PSEN t PXIZ CLCL-25 ns tAVIV Address to Valid Instruction In 5 tCLCL-105 ns t 1 PSEN Low to Address Float 10 ns PLAZ tRLRH RD Pulse Width 6 tCLCL-100 ns tWLWH WR Pulse Width 6 tCLCL-100 ns tRLDV RD Low to Valid Data In 5 tCLCL-165 ns t 1 Data Hold After RD High 0 ns RHDX t 1 Data Float After RD High 2 t RHDZ CLCL-60 ns tLLDV ALE Low Valid Data In 8 tCLCL-150 ns tAVDV Address to Valid Data In 9 tCLCL-165 ns tLLWL ALE Low to RD or WR Low 3 tCLCL-50 3 tCLCL+50 ns tAVWL Address Valid to WR Low 4 tCLCL-130 ns tQVWX Data Valid Before WR High tCLCL-33 ns tWHQX Data Hold After WR High tCLCL-33 ns t Data Valid to WR High 7 t QVWH CLCL-150 ns t 1 RD Low to Address Float 0 ns RLAZ tWHLH RD or WR High to ALE High tCLCL-40 tCLCL+40 ns
Note:
* Post-radiation performance guaranteed at 25°C per MIL-STD-883 Method 1019 at 1.0E6 rads(Si). 1. Guaranteed, but not tested. 10
(VDD = 5.0V ±10%; -55°C < TC < +125°C)
SYMBOL PARAMETER MINIMUM MAXIMUM UNIT
tCLCL Clock Period 50 ns 1/tCLCL Oscillator Frequency 20 MHz tLHLL ALE Pulse Width 2 tCLCL-40 ns tAVLL Address Valid to ALE Low tCLCL-40 ns t 1 Address Hold after ALE Low t LLAX CLCL-30 ns tLLIV ALE Low to Valid Instruction 4 tCLCL-100 ns tLLPL ALE Low to PSEN Low tCLCL-30 ns tPLPH PSEN Pulse Width 3 tCLCL-45 ns tPLIV PSEN Low to Valid Instruction In 3 tCLCL-105 ns t 1 Input Instruction Hold after PSEN 0 ns PXIX t 1 Input Instruction Float after PSEN t PXIZ CLCL-25 ns tAVIV Address to Valid Instruction In 5 tCLCL-105 ns t 1 PSEN Low to Address Float 10 ns PLAZ tRLRH RD Pulse Width 6 tCLCL-100 ns tWLWH WR Pulse Width 6 tCLCL-100 ns tRLDV RD Low to Valid Data In 5 tCLCL-165 ns t 1 Data Hold After RD High 0 ns RHDX t 1 Data Float After RD High 2 t RHDZ CLCL-60 ns tLLDV ALE Low Valid Data In 8 tCLCL-150 ns tAVDV Address to Valid Data In 9 tCLCL-165 ns tLLWL ALE Low to RD or WR Low 3 tCLCL-50 3 tCLCL+50 ns tAVWL Address Valid to WR Low 4 tCLCL-130 ns tQVWX Data Valid Before WR High tCLCL-33 ns tWHQX Data Hold After WR High tCLCL-33 ns t Data Valid to WR High 7 t QVWH CLCL-150 ns t 1 RD Low to Address Float 0 ns RLAZ tWHLH RD or WR High to ALE High tCLCL-40 tCLCL+40 ns
Note:
* Post-radiation performance guaranteed at 25°C per MIL-STD-883 Method 1019 at 1.0E6 rads(Si). 1. Guaranteed, but not tested. 10