Datasheet RHK3845MKDICE (Analog Devices) - 5

DICE/DWF SPECIFICATION RH3845MKDICE
t able 3: electrical characteristics Specifications are at TA = 25°C, VIN = 20V, VCC = BOOST = 10V, SHDN = 2V, RSET = 49.9k, SENSE– = SENSE+ = 10V, SGND = PGND = SW = 0V. (Post-Irradiation) 10KRADS (Si) 20KRADS (Si) 50KRADS (Si) 100KRADS (Si) 200KRADS (Si) PARAMETER CONDITIONS MIN MAX MIN MAX MIN MAX MIN MAX MIN MAX UNITS
VIN Minimum Start Voltage (Note 2) 7.5 7.5 7.5 7.5 7.5 V VIN UVLO Threshold (Falling) 4 4 4 4 4 V VIN Supply Current VCC > 9V 200 200 200 200 200 μA VIN Shutdown Current VSHDN = 0.3V 100 100 100 100 100 μA BOOST Supply Current (Note 3) 2 2 2 2 2 mA VCC Supply Current 4.5 4.5 4.5 4.5 4.5 mA VCC Current Limit –40 –40 –40 –40 –40 mA SHDN Enable Threshold (Rising) 1.30 1.5 1.30 1.5 1.30 1.5 1.30 1.5 1.30 1.5 V SHDN Hysteresis 100 180 100 180 100 180 100 180 80 180 mV Reference Voltage 1.214 1.250 1.210 1.246 1.208 1.244 1.204 1.240 1.187 1.223 V VFB Input Bias Current ±100 ±150 ±170 ±300 ±400 nA VFB Error Amp Transconductance 350 330 300 280 250 µS Error Amp Sink/Source Current 35 35 35 35 30 µA Peak Current Limit Sense Voltage 90 120 85 120 85 120 80 120 75 120 mV Soft-Start Charge Current 8 16 8 16 6 16 5 16 4 16 µA Sense Pins Common-Mode Range 36 36 36 36 36 V Sense Pins Input Current VSENSE(CM) > 4V 400 400 400 400 400 µA Reverse Protect Sense Voltage VMODE = 7.5V 120 120 120 120 120 mV Reverse Current Sense Voltage Offset VMODE = VFB 20 20 20 20 20 mV Switching Frequency RT = 49.9k 270 370 270 370 270 370 270 370 270 370 kHz Programmable Frequency Range 100 500 100 500 100 500 100 500 100 500 kHz Non-Overlap Time TG to BG 350 350 350 350 350 ns Non-Overlap Time BG to TG 350 350 350 350 350 ns TG Minimum On-Time 500 500 500 500 500 ns TG Minimum Off-Time 350 350 350 360 360 ns TG, BG Drive On Voltage VCC = 10V 8 8 8 8 8 V TG, BG Drive Off Voltage 0.1 0.1 0.1 0.1 0.1 V TG, BG Drive Rise Time CTG = CBG = 3300pF 60 60 60 60 60 ns TG, BG Drive Fall Time CTG = CBG = 3300pF 60 60 60 60 60 ns
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings may
Note 3:
Supply current specification does not include switch drive cause permanent damage to the device. Exposure to any Absolute Maximum currents. Actual supply currents will be higher. Rating condition for extended periods may affect device reliability.
Note 4:
Connect the MODE pin to VFB for pulse-skipping mode or VCC
Note 2:
V for forced continuous mode. Burst Mode operation is not available in IN voltages below the start-up threshold (7.5V) are only supported when the V the RH3845 version of this part. CC is externally driven above 6.5V.
table 4: electrical test requireMents PDA Test Notes MIL-STD-883 TEST REQUIREMENTS SUBGROUP
The PDA is specified as 5% based on failures from Group A, Subgroup 1, Final Electrical Test Requirements (Method 5004) 1*, 2, 3 tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1, 2, 3 5004 of MIL-STD-883. The verified failures of Group A, Subgroup 1, after Group B and D for Class S, 1, 2, 3 burn-in divided by the total number of devices submitted for burn-in in that End Point Electrical Parameters (Method 5005) lot shall be used to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given. 5 Document Outline Description Typical Application Description absolute Maximum Ratings Dice Pinout Table 1: Dice/DWF Electrical Test Limits Table 2: Electrical Characteristics Table 3: Electrical Characteristics Table 4: Electrical Test Requirements Total Dose Bias Circuit — Run Mode Total Dose Bias Circuit — Shutdown Mode Burn-in Circuit — run mode Typical Performance characteristics DESCRIPTION ABSOLUTE MAXIMUM RATINGS TABLE 1 Dice/DWF Electrical Test Limits TABLE 2 Electrical Characteristics TABLE 3 Electrical Characteristics Table 5. Electrical Test Requirements Total Dose Bias Circuit Burn-In Circuit Typical Performance Characteristics preirradiation Typical Performance Characteristics Post-irradiation Revision History