DICE/DWF SPECIFICATION DICE/DWF SPECIFICA RHK3845MKDICE Radiation Hardened High Voltage Synchronous Step-Down Regulator Kit with Power NMOS FETs DescriptionDIE CROSS REFERENCE The RHK3845MKDICE is a radiation hardened dice kit that LTC® FinishedOrder includes one RH3845MK high voltage synchronous step- Part NumberPart Number down controller and two RH411MK power NMOS FETs. In RHK3845MK RHK3845MK DICE its final hybrid configuration, the RHK3845MK is a wide RHK3845MK RHK3845MK DWF* input voltage range, step-down, synchronous switching Please refer to LTC standard product data sheet for regulator. Input voltage range is 7.5V to 60V. With an other applicable product information. external VCC supply, minimum input can be reduced to Each kit contains one RH3845MK die and two 4.0V. The final hybrid supports output voltages up to 36V, RH411MK dice. and a switching frequency range of 100kHz to 500kHz. *DWF = DICE in wafer form. The bulk input and output capacitors, inductor, diodes and L, LT, LTC, LTM, Linear Technology, the Linear logo and Burst Mode are registered trademarks other passive elements are needed to finish the design. of Linear Technology Corporation. All other trademarks are the property of their respective owners. Note that Burst Mode® operation which is available in the LT3845 is not available in the RH3845 version. typical application VIN RH411MK BOOST D G VIN TG RH3845MK S SHDN SW VOUT RH411MK CSS VCC D G MODE BG S VFB PGND VC SYNC SENSE+ fSET SENSE– GND RH3845MK TA01 1 Document Outline Description Typical Application Description absolute Maximum Ratings Dice Pinout Table 1: Dice/DWF Electrical Test Limits Table 2: Electrical Characteristics Table 3: Electrical Characteristics Table 4: Electrical Test Requirements Total Dose Bias Circuit — Run Mode Total Dose Bias Circuit — Shutdown Mode Burn-in Circuit — run mode Typical Performance characteristics DESCRIPTION ABSOLUTE MAXIMUM RATINGS TABLE 1 Dice/DWF Electrical Test Limits TABLE 2 Electrical Characteristics TABLE 3 Electrical Characteristics Table 5. Electrical Test Requirements Total Dose Bias Circuit Burn-In Circuit Typical Performance Characteristics preirradiation Typical Performance Characteristics Post-irradiation Revision History