Datasheet ADG733, ADG734 (Analog Devices) - 4

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ADG733/ADG734–SPECIFICATIONS1 DUAL SUPPLY (VDD = +2.5 V 10%, VSS = –2.5 V 10%, GND = 0 V, unless otherwise noted.) B Version –40 C Parameter +25 C to +85 C Unit Test Conditions/Comments
ANALOG SWITCH Analog Signal Range VSS to VDD V On Resistance (RON) 2.5 Ω typ VS = VSS to VDD, IDS = 10 mA; 4.5 5.0 Ω max Test Circuit 1 On Resistance Match between 0.1 Ω typ VS = VSS to VDD, IDS = 10 mA Channels (∆RON) 0.4 Ω max On Resistance Flatness (RFLAT(ON)) 0.5 Ω typ VS = VSS to VDD, IDS = 10 mA 1.2 Ω max LEAKAGE CURRENTS VDD = +2.75 V, VSS = –2.75 V Source OFF Leakage IS (OFF) ±0.01 nA typ VS = +2.25 V/–1.25 V, VD = –1.25 V/+2.25 V; ±0.1 ±0.3 nA max Test Circuit 2 Channel ON Leakage ID, IS (ON) ±0.01 nA typ VS = VD = +2.25 V/–1.25 V, Test Circuit 3 ±0.1 ±0.5 nA max DIGITAL INPUTS Input High Voltage, VINH 1.7 V min Input Low Voltage, VINL 0.7 V max Input Current IINL or IINH 0.005 µA typ VIN = VINL or VINH ±0.1 µA max CIN, Digital Input Capacitance 4 pF typ DYNAMIC CHARACTERISTICS2 tON 21 ns typ RL = 300 Ω, CL = 35 pF; 35 ns max VS = 1.5 V, Test Circuit 4 tOFF 10 ns typ RL = 300 Ω, CL = 35 pF; 16 ns max VS = 1.5 V, Test Circuit 4 ADG733 tON(EN) 21 ns typ RL = 300 Ω, CL = 35 pF; 40 ns max VS = 1.5 V, Test Circuit 5 tOFF(EN) 10 ns typ RL = 300 Ω, CL = 35 pF; 16 ns max VS = 1.5 V, Test Circuit 5 Break-Before-Make Time Delay, tD 13 ns typ RL = 300 Ω, CL = 35 pF; 1 ns min VS = 1.5 V, Test Circuit 6 Charge Injection ±5 pC typ VS = 0 V, RS = 0 Ω, CL = 1 nF; Test Circuit 7 Off Isolation –72 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; Test Circuit 8 Channel-to-Channel Crosstalk –67 dB typ RL = 50 Ω, CL = 5 pF, f = 1 MHz; Test Circuit 9 –3 dB Bandwidth 200 MHz typ RL = 50 Ω, CL = 5 pF, Test Circuit 10 CS (OFF) 11 pF typ f = 1 MHz CD, CS (ON) 34 pF typ f = 1 MHz POWER REQUIREMENTS VDD = 2.75 V IDD 0.001 µA typ Digital Inputs = 0 V or 2.75 V 1.0 µA max ISS 0.001 µA typ VSS = –2.75 V 1.0 µA max Digital Inputs = 0 V or 2.75 V NOTES 1Temperature range is as follows: B Version: –40°C to +85°C. 2Guaranteed by design, not subject to production test. Specifications subject to change without notice. –4– REV. B Document Outline Features Applications General Description Functional Block Diagrams Product Highlights Specifications Absolute Maximum Ratings Pin Configurations Terminology Typical Performance Characteristics Test Circuits Outline Dimensions Ordering Guide Revision History