Datasheet IRLZ34N (International Rectifier) - 7

FabricanteInternational Rectifier
DescripciónHEXFET Power MOSFET, VDSS = 55 V, RDS(on) = 0.035 Ω, ID = 30 A, TO-220AB
Páginas / Página9 / 7 — Peak Diode Recovery dv/dt Test Circuit. D.U.T. Fig 14
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Peak Diode Recovery dv/dt Test Circuit. D.U.T. Fig 14

Peak Diode Recovery dv/dt Test Circuit D.U.T Fig 14

Versión de texto del documento

IRLZ34N
Peak Diode Recovery dv/dt Test Circuit
+ Circuit Layout Considerations
D.U.T
• Low Stray Inductance ƒ • Ground Plane • Low Leakage Inductance Current Transformer - + ‚ „ - + -  RG • dv/dt controlled by R + G • Driver same type as D.U.T. V - DD • ISD controlled by Duty Factor "D" • D.U.T. - Device Under Test Driver Gate Drive P.W. Period D = P.W. Period VGS=10V * D.U.T. ISD Waveform Reverse Recovery Body Diode Forward Current Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt VDD Re-Applied Voltage Body Diode Forward Drop Inductor Curent Ripple ≤ 5% ISD * VGS = 5V for Logic Level Devices
Fig 14.
For N-Channel HEXFETS