Datasheet ADXL375-EP (Analog Devices) - 3

Enhanced Product ADXL375-EP SPECIFICATIONS
TA = 25°C, VS = 2.5 V, VDD I/O = 2.5 V, acceleration = 0 g, CS = 10 µF tantalum, CI/O = 0.1 µF, and output data rate (ODR) = 800 Hz, unless otherwise noted.
Table 1. Parameter Test Conditions/Comments Min Typ1 Max Unit
SENSOR INPUT Each axis Measurement Range2 ±180 ±200 g Nonlinearity Percentage of full scale ±0.25 % Cross-Axis Sensitivity3 ±2.5 % SENSITIVITY Each axis Sensitivity at X 2, 4 OUT, YOUT, ZOUT ODR ≤ 800 Hz 18.4 20.5 22.6 LSB/g Scale Factor at X 2, 4 OUT, YOUT, ZOUT ODR ≤ 800 Hz 44 49 54 mg/LSB Sensitivity Change Due to Temperature ±0.02 %/°C 0 g OFFSET Each axis 0 g Output for XOUT, YOUT, ZOUT −6000 ±400 +6000 mg 0 g Offset vs. Temperature ±10 mg/°C NOISE X-, y-, and z-axes 5 mg/√Hz OUTPUT DATA RATE AND BANDWIDTH5 User selectable Output Data Rate (ODR)4, 6 0.1 3200 Hz SELF-TEST7 Output Change in Z-Axis 6.4 g POWER SUPPLY Operating Voltage Range (VS) 2.0 2.5 3.6 V Interface Voltage Range (VDD I/O) 1.7 1.8 VS V Supply Current Measurement Mode ODR ≥ 100 Hz 145 µA ODR ≤ 3 Hz 35 µA Standby Mode 0.1 µA Turn-On and Wake-Up Time8 ODR = 3200 Hz 1.4 ms TEMPERATURE Operating Temperature Range −55 +105 °C WEIGHT Device Weight 30 mg 1 Typical specifications are for at least 68% of the population of devices and are based on the worst case of mean ± 1 σ distribution, except for sensitivity, which represents the target value. 2 Minimum and maximum specifications represent the worst case of mean ± 3 σ distribution and are not guaranteed in production. 3 Cross axis sensitivity is defined as coupling between any two axes. 4 The output format for the 1600 Hz and 3200 Hz output data rates is different from the output format for the other output data rates. For more information, see the ADXL375 data sheet. 5 Bandwidth is the −3 dB frequency and is half the output data rate: bandwidth = ODR/2. 6 Output data rates < 6.25 Hz exhibit additional offset shift with increased temperature. 7 Self test change is defined as the output (g) when the SELF_TEST bit = 1 (DATA_FORMAT register, Address 0x31) minus the output (g) when the SELF_TEST bit = 0. Due to device filtering, the output reaches its final value after 4 × τ when enabling or disabling self test, where τ = 1/(data rate). For the self test to operate correctly, the part must be in normal power operation (LOW_POWER bit = 0 in the BW_RATE register, Address 0x2C). 8 Turn on and wake-up times are determined by the user defined bandwidth. At a 100 Hz data rate, the turn on and wake-up times are each approximately 11.1 ms. For other data rates, the turn on and wake-up times are each approximately τ + 1.1 ms, where τ = 1/(data rate). Rev. 0 | Page 3 of 7 Document Outline Features Enhanced Product Features Applications General Description Functional Block Diagram Revision History Specifications Absolute Maximum Ratings Thermal Resistance ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Outline Dimensions Ordering Guide