Datasheet 2N3906 (ON Semiconductor) - 3
| Fabricante | ON Semiconductor |
| Descripción | Small Signal PNP Bipolar Transistor, TO-92 |
| Páginas / Página | 7 / 3 — 2N3906. ORDERING INFORMATION. Device. Package. Shipping. Figure 1. Delay … |
| Revisión | 4 |
| Formato / tamaño de archivo | PDF / 178 Kb |
| Idioma del documento | Inglés |
2N3906. ORDERING INFORMATION. Device. Package. Shipping. Figure 1. Delay and Rise Time Equivalent Test Circuit
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2N3906 ORDERING INFORMATION Device Package Shipping
† 2N3906 TO−92 5000 Units / Bulk 2N3906G TO−92 5000 Units / Bulk (Pb−Free) 2N3906RL1 TO−92 2000 / Tape & Reel 2N3906RL1G TO−92 2000 / Tape & Reel (Pb−Free) 2N3906RLRA TO−92 2000 / Tape & Reel 2N3906RLRAG TO−92 2000 / Tape & Reel (Pb−Free) 2N3906RLRM TO−92 2000 / Tape & Ammo Box 2N3906RLRMG TO−92 2000 / Tape & Ammo Box (Pb−Free) 2N3906RLRP TO−92 2000 / Tape & Ammo Box 2N3906RLRPG TO−92 2000 / Tape & Ammo Box (Pb−Free) †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. 3 V 275 < 1 ns +0.5 V 10 k CS < 4 pF* 10.6 V 300 ns DUTY CYCLE = 2% * Total shunt capacitance of test jig and connectors
Figure 1. Delay and Rise Time Equivalent Test Circuit
3 V < 1 ns +9.1 V 275 10 k 0 1N916 CS < 4 pF* 10 < t1 < 500 ms t 10.9 V 1 DUTY CYCLE = 2% * Total shunt capacitance of test jig and connectors
Figure 2. Storage and Fall Time Equivalent Test Circuit http://onsemi.com 3
† 2N3906 TO−92 5000 Units / Bulk 2N3906G TO−92 5000 Units / Bulk (Pb−Free) 2N3906RL1 TO−92 2000 / Tape & Reel 2N3906RL1G TO−92 2000 / Tape & Reel (Pb−Free) 2N3906RLRA TO−92 2000 / Tape & Reel 2N3906RLRAG TO−92 2000 / Tape & Reel (Pb−Free) 2N3906RLRM TO−92 2000 / Tape & Ammo Box 2N3906RLRMG TO−92 2000 / Tape & Ammo Box (Pb−Free) 2N3906RLRP TO−92 2000 / Tape & Ammo Box 2N3906RLRPG TO−92 2000 / Tape & Ammo Box (Pb−Free) †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. 3 V 275 < 1 ns +0.5 V 10 k CS < 4 pF* 10.6 V 300 ns DUTY CYCLE = 2% * Total shunt capacitance of test jig and connectors
Figure 1. Delay and Rise Time Equivalent Test Circuit
3 V < 1 ns +9.1 V 275 10 k 0 1N916 CS < 4 pF* 10 < t1 < 500 ms t 10.9 V 1 DUTY CYCLE = 2% * Total shunt capacitance of test jig and connectors
Figure 2. Storage and Fall Time Equivalent Test Circuit http://onsemi.com 3