Datasheet LTC1287 (Analog Devices) - 6

FabricanteAnalog Devices
Descripción3V Single Chip 12-Bit Data Acquisition System
Páginas / Página16 / 6 — BLOCK I. D AGRA. TEST CIRCUITS. On and Off Channel Leakage Current. …
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BLOCK I. D AGRA. TEST CIRCUITS. On and Off Channel Leakage Current. Voltage Waveforms for DOUT Delay Time, tdDO

BLOCK I D AGRA TEST CIRCUITS On and Off Channel Leakage Current Voltage Waveforms for DOUT Delay Time, tdDO

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LTC1287
W BLOCK I D AGRA
8 7 VCC CLK INPUT SHIFT REGISTER OUTPUT 6 SHIFT DOUT REGISTER 2 +IN SAMPLE ANALOG 3 AND –IN INPUT MUX HOLD COMP 12-BIT SAR 12-BIT CAPACITIVE DAC CONTROL 1 5 4 AND CS TIMING V GND REF LTC1287 BD
TEST CIRCUITS On and Off Channel Leakage Current Voltage Waveforms for DOUT Delay Time, tdDO
3V CLK ION 0.45V A ON CHANNEL tdDO IOFF 2.1V A D OFF CHANNEL OUT 0.6V LTC1287 TC03 POLARITY
Voltage Waveforms for D
LTC1287 TC1
OUT Rise and Fall Times, tr, tf Load Circuit for t
2.1V
dis and ten
DOUT 0.6V TEST POINT tr tf LTC1287 TC04 3V t 3k dis WAVEFORM 2, ten DOUT tdis WAVEFORM 1
Voltage Waveforms for tdis
100pF CS 2.1V LTC1287 TC05
Load Circuit for tdDO, tr and tf
DOUT 90% WAVEFORM 1 1.5V (SEE NOTE 1) tdis DOUT 3k WAVEFORM 2 10% (SEE NOTE 2) DOUT TEST POINT NOTE 1: WAVEFORM 1 IS FOR AN OUTPUT WITH INTERNAL CONDITIONS SUCH 100pF THAT THE OUTPUT IS HIGH UNLESS DISABLED BY THE OUTPUT CONTROL. NOTE 2: WAVEFORM 2 IS FOR AN OUTPUT WITH INTERNAL CONDITIONS SUCH LTC1287 TC06 THAT THE OUTPUT IS LOW UNLESS DISABLED BY THE OUTPUT CONTROL. LTC1287 TC02 1287fa 6