Datasheet BT138-800E (NXP) - 8

FabricanteNXP
Descripción4Q Triac
Páginas / Página13 / 8 — NXP Semiconductors. BT138-800E. 4Q Triac. Fig. 8. Normalized latching …
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NXP Semiconductors. BT138-800E. 4Q Triac. Fig. 8. Normalized latching current as a function of. junction temperature

NXP Semiconductors BT138-800E 4Q Triac Fig 8 Normalized latching current as a function of junction temperature

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NXP Semiconductors BT138-800E 4Q Triac
003aaj946 3 003aaj947 3 IGT IL IGT(25°C) (1) IL(25°C) (2) 2 2 (3) (4) (1) (2) (3) 1 1 (4) 0 0 -50 0 50 100 150 -50 0 50 100 150 Tj (°C) Tj (°C) (1) T2- G+
Fig. 8. Normalized latching current as a function of
(2) T2- G-
junction temperature
(3) T2+ G- (4) T2+ G+
Fig. 7. Normalized gate trigger current as a function of junction temperature
003aaj948 3 40 003aaj949 IT IH (A) IH(25°C) 30 2 20 1 (1) (2) (3) 10 0 0 -50 0 50 100 150 0 0.5 1 1.5 2 2.5 Tj (°C) VT (V)
Fig. 9. Normalized holding current as a function of
Vo = 1.175 V; Rs = 0.0316 Ω
junction temperature
(1) Tj = 125 °C; typical values (2) Tj = 125 °C; maximum values (3) Tj = 25 °C; maximum values
Fig. 10. On-state current as a function of on-state voltage
BT138-800E All information provided in this document is subject to legal disclaimers. © NXP N.V. 2013. All rights reserved
Product data sheet 30 August 2013 8 / 13
Document Outline 1. General description 2. Features and benefits 3. Applications 4. Quick reference data 5. Pinning information 6. Ordering information 7. Limiting values 8. Thermal characteristics 9. Characteristics 10. Package outline 11. Legal information