Datasheet MAX6846, MAX6847, MAX6848, MAX6849 (Maxim) - 2

Low-Power, Adjustable Battery Monitors with Hysteresis and Integrated µP Reset ABSOLUTE MAXIMUM RATINGS
VDD, VCC to GND..-0.3V to +6V* Continuous Power Dissipation (TA = +70°C) Open-Drain LBO, LBOH, LBOL to GND ...-0.3V to +6V* 8-Pin SOT23 (derate 8.9mW/°C above +70°C)..714mW Open-Drain RESET to GND ..-0.3V to +6V* Operating Temperature Range .. -40°C to +85°C Push-Pull RESET to GND..-0.3V to (VCC + 0.3V) Junction Temperature ..+150°C HTHIN, LTHIN to GND..-0.3V to (VDD + 0.3V) Storage Temperature Range ...-65°C to +150°C MR to GND ...-0.3V to (VCC + 0.3V) Lead Temperature (soldering, 10s) ...+300°C Input/Output Current, All Pins ...20mA *Applying 7V for a duration of 1ms does not damage the device. Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
ELECTRICAL CHARACTERISTICS
(VDD = 1.6V to 5.5V, VCC = 1.2V to 5.5V, TA = -40°C to +85°C, unless otherwise specified. Typical values are at TA = +25°C.) (Note 1)
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS
VDD Operating Voltage Range VDD 1.6 5.5 V
MAX6846–MAX6849
TA = 0°C to +85°C 1.0 5.5 VCC Operating Voltage Range VCC V TA = -40°C to +85°C 1.2 5.5 VCC + VDD Supply Current ICC + IDD VDD = 3.6V, VCC = 3.3V, no load (Note 2) 2.5 7 µA
MAX6846/MAX6847 VDD THRESHOLDS
HTHIN rising, LBO is deasserted when HTHIN Threshold VHTH 600 615 630 mV HTHIN rises above VHTH LTHIN falling, LBO is asserted when LTHIN LTHIN Threshold VLTH 600 615 630 mV falls below VLTH
MAX6848/MAX6849 VDD THRESHOLDS
HTHIN rising, LBOH is deasserted when HTHIN+ Threshold VHTH+ 600 615 630 mV HTHIN rises above VHTH+ HTHIN falling, LBOH is asserted when HTHIN- Threshold VHTH- 567 582 597 mV HTHIN falls below VHTH- LTHIN rising, LBOL is deasserted when LTHIN+ Threshold VLTH+ 600 615 630 mV LTHIN rises above VLTH+ LTHIN falling, LBOL is asserted when LTHIN- Threshold VLTH- 567 582 597 mV LTHIN falls below VLTH-
MAX6846–MAX6849
HTHIN/LTHIN Leakage Current ILKG VHTHIN or VLTHIN ≥ 400mV 20 nA LBO , LBO L, LBO H Ti m eout P er i od tLBOP HTHIN/LTHIN rising above threshold 150 225 300 ms LBO, LBOL, LBOH Delay Time tLBOD HTHIN/LTHIN falling below threshold 100 µs (VDD or VCC) ≥ 1.2V, ISINK = 50µA, asserted 0.3 low (VDD or VCC) ≥ 1.6V, ISINK = 100µA, 0.3 asserted low LBO, LBOL, LBOH Output Low VOL V (VDD or VCC) ≥ 2.7V, ISINK = 1.2mA, 0.3 asserted low (VDD or VCC) ≥ 4.5V, ISINK = 3.2mA, 0.3 asserted low
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