Datasheet RH117 (Analog Devices) - 3

RH117
TABLE 1: ELECTRICAL CHARACTERISTICS (Preirradiation) (Note 5) 10KRAD(Si) 20KRAD(Si) 50KRAD(Si) 100KRAD(Si) SYMBOL PARAMETER CONDITIONS NOTES MIN MAX MIN MAX MIN MAX MIN MAX UNITS
IADJ Adjust Pin Current 100 100 100 100 µA ∆IADJ Adjust Pin Current 10mA ≤ IOUT ≤ IMAX 5 5 5 5 µA Change 3V ≤ (VIN – VOUT) ≤ 40V, 5 5 5 5 µA IOUT = 10mA IMIN Minimum Load (VIN – VOUT) = 40V 5 5 5 5 mA Current Current Limit (VIN – VOUT) ≤ 15V H Package 0.5 0.5 0.5 0.5 A K Package 1.5 1.5 1.5 1.5 A (VIN – VOUT) ≤ 40V H Package 0.15 0.15 0.15 0.15 A K Package 0.30 0.30 0.30 0.30 A
Note 1:
Unless otherwise specified, these specifications apply for
Note 2:
Regulation is measured at a constant junction temperature using V pulse testing with a low duty cycle. Changes in output voltage due to IN – VOUT = 5V; and IOUT = 0.1A for the H package (TO-39) and I heating effects are covered under the specification for thermal regulation. OUT = 0.5A for the K package (TO-3) package. Although power dissipation is internally limited, these specifications are applicable for power
Note 3:
Guaranteed by design, characterization or correlation to other dissipations of 2W for the TO-39 and 20W for the TO-3. I tested parameters. MAX is 0.5A for the TO-39 and 1.5A for the TO-3.
Note 4:
TJ = 25°C unless otherwise noted.
TOTAL DOSE BIAS CIRCUIT
RH117 15V VIN OUTPUT ADJ 0.1µF 2k 61.9Ω –15V RH117 TA01
TABLE 1: ELECTRICAL CHARACTERISTICS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
Final Electrical Test Requirements (Method 5004) 1*,2,3 The PDA is specified as 5% based on failures from group A, subgroup 1, tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3 5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup Group C and D End Point Electrical Parameters 1 1, after burn-in divided by the total number of devices submitted for burn- (Method 5005) in in that lot shall be used to determine the percent for the lot. * PDA Applies to subgroup 1. See PDA Test Notes. ADI reserves the right to test to tighter limits than those given. Rev. D Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license F o is r more granted in by f ormation implication w orw w.a other nalo wise g.com under any patent or patent rights of Analog Devices. 3 Document Outline Description Burn-In Circuit Absolute Maximum Ratings Package/Order information Table 1: Electrical Characteristics Total Dose Bias Circuit Table 1: Electrical characteristics Typical Performance Characteristics Revision History