Datasheet ADT7517-KGD (Analog Devices)
Fabricante | Analog Devices |
Descripción | SPI-/I2C-Compatible, Temperature Sensor, 4-Channel ADC and Quad Voltage Output |
Páginas / Página | 11 / 1 — SPI-/I2C-Compatible Temperature Sensor. with 4-Channel ADC and Quad … |
Revisión | A |
Formato / tamaño de archivo | PDF / 243 Kb |
Idioma del documento | Inglés |
SPI-/I2C-Compatible Temperature Sensor. with 4-Channel ADC and Quad Voltage Output. Known Good Die. ADT7517-KGD. FEATURES
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SPI-/I2C-Compatible Temperature Sensor with 4-Channel ADC and Quad Voltage Output Known Good Die ADT7517-KGD FEATURES GENERAL DESCRIPTION Four 10-bit DACs
The ADT7517-KGD combines a 10-bit temperature-to-digital
Buffered voltage output
converter, a 10-bit, 4-channel ADC, and a quad 10-bit DAC in die
Guaranteed monotonic by design over all codes
form. The ADT7517-KGD also includes a band gap temperature
10-bit temperature-to-digital converter
sensor and a 10-bit ADC to monitor and digitize the temperature
10-bit, 4-channel ADC
reading to a resolution of 0.25°C.
DC input bandwidth Input range: 0 V to 2.28 V
The ADT7517-KGD operates from a single 2.7 V to 5.5 V supply.
Temperature range: −40°C to +120°C
The input voltage range on the ADC channels is 0 V to 2.28 V, and
Temperature sensor accuracy: ±3°C typical
the input bandwidth is dc. The reference for the ADC channels is
Supply range: 2.7 V to 5.5 V
derived internally. The output voltage of the DAC ranges from
DAC output range: 0 V to V
0 V to VDD, with an output voltage settling time of 7 μs typical.
DD Power-down current: <10 μA
The ADT7517-KGD provides two serial interface options: a 4-wire
Internal 2.28 VREF option
serial interface that is compatible with SPI, QSPI™, MICROWIRE®,
Double-buffered input logic
and DSP interface standards, and a 2-wire SMBus/I2C interface.
Buffered reference input
The ADT7517-KGD features a standby mode that is controlled
Power-on reset to 0 V DAC output
through the serial interface.
Simultaneous update of outputs (LDAC function)
The reference for the four DACs is derived either internally or
On-chip, rail-to-rail output buffer amplifier
from a reference pad. The outputs of all DACs can be updated
Compatible with SPI, I2C, QSPI, MICROWIRE, and DSP
simultaneously using the software LDAC function or the external
Support for SMBus packet error checking (PEC)
LDAC pad. The ADT7517-KGD incorporates a power-on reset
Known good die (KGD): a die that is tested and guaranteed
circuit, ensuring that the DAC output powers up to 0 V and
over the full specifications of the data sheet
remains at 0 V until a valid write takes place.
APPLICATIONS
Additional application and technical information can be found
Process control
in the ADT7517 data sheet.
Smart battery chargers Portable equipment FUNCTIONAL BLOCK DIAGRAM ADDRESS POINTER INTERNAL REGISTER TEMPERATURE ON-CHIP VALUE REGISTER T ADT7517-KGD HIGH LIMIT TEMPERATURE REGISTERS SENSOR X TLOW LIMIT EXTERNAL U REGISTERS TEMPERATURE DAC A STRING VOUT-A VALUE REGISTER L M LIMIT V REGISTERS DAC A DD LIMIT REGISTERS UX COMPARATOR ITA D+/AIN1 M IG AINHIGH LIMIT DAC B STRING D REGISTERS V REGISTERS DAC B OUT-B D–/AIN2 AL IT ANALOG AIN ADC G LOW LIMIT LDAC/AIN3 MUX REGISTERS DI DAC C STRING V CONTROL CONFIG. 1 OUT-C AIN4 REGISTERS DAC C REGISTER VDD CONTROL CONFIG. 2 VALUE REGISTER REGISTER DAC D STRING V REGISTERS DAC D OUT-D AIN1 CONTROL CONFIG. 3 V VALUE REGISTER REGISTER DD SENSOR GAIN POWER- AIN2 DAC CONFIGURATION SELECT DOWN VALUE REGISTER REGISTERS LOGIC LOGIC AIN3 LDAC CONFIGURATION VALUE REGISTER REGISTERS STATUS INTERRUPT MASK INT/INT AIN4 REGISTERS REGISTERS VALUE REGISTER INTERNAL SPI/SMBus INTERFACE REFERENCE
1 6-00
V GND CS SCL/SCLK SDA/DIN DD DOUT/ADD LDAC/AIN3 VREF-IN
1068 Figure 1.
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Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAM TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS DAC AC CHARACTERISTICS TIMING DIAGRAMS ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS OUTLINE DIMENSIONS DIE SPECIFICATIONS AND ASSEMBLY RECOMMENDATIONS ORDERING GUIDE