Datasheet 6N138, 6N139 (Toshiba) - 5
| Fabricante | Toshiba |
| Descripción | Photocoupler IRED & Photo IC |
| Páginas / Página | 6 / 5 — Test Circuit 1. Test Circuit 2 |
| Formato / tamaño de archivo | PDF / 308 Kb |
| Idioma del documento | Inglés |
Test Circuit 1. Test Circuit 2
Línea de modelo para esta hoja de datos
Versión de texto del documento
6N138,6N139
Test Circuit 1.
IF Pulse gen. 0 Zo = 50Ω IF 1 8 +5V tf = 5ns VO 5V 2 7 RL 10% Duty cycle (Saturated 1.5V 1.5V 1 / f < 100μs 3 6 VO Response) VOL IF MonitorF 4 CL (*) 5 tpHL tpLH Ω 100 V 5V O 10% 90% (Non- 90% 10% Saturated tr tf Response) (*)CL is approximately 15pF which includes probe and stray wiring capacitance.
Test Circuit 2.
RCC 1 8 +5V t IF r, tf = 0.64μs 400V 90% L 2 7 R VCM 10% 0V A 3 6 t V r tf O B 4 5 VO 5V VFF Switch at A: IF = 0mA + VCM － VOL VO Switch at B: IF = 1.6mA Pulse gen © 2019 5 2019-06-10 Toshiba Electronic Devices & Storage Corporation
Test Circuit 1.
IF Pulse gen. 0 Zo = 50Ω IF 1 8 +5V tf = 5ns VO 5V 2 7 RL 10% Duty cycle (Saturated 1.5V 1.5V 1 / f < 100μs 3 6 VO Response) VOL IF MonitorF 4 CL (*) 5 tpHL tpLH Ω 100 V 5V O 10% 90% (Non- 90% 10% Saturated tr tf Response) (*)CL is approximately 15pF which includes probe and stray wiring capacitance.
Test Circuit 2.
RCC 1 8 +5V t IF r, tf = 0.64μs 400V 90% L 2 7 R VCM 10% 0V A 3 6 t V r tf O B 4 5 VO 5V VFF Switch at A: IF = 0mA + VCM － VOL VO Switch at B: IF = 1.6mA Pulse gen © 2019 5 2019-06-10 Toshiba Electronic Devices & Storage Corporation