Datasheet RH1021-10 (Analog Devices) - 4
| Fabricante | Analog Devices |
| Descripción | Precision 10V Reference |
| Páginas / Página | 6 / 4 — TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS. … |
| Revisión | F |
| Formato / tamaño de archivo | PDF / 667 Kb |
| Idioma del documento | Inglés |
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS. SUBGROUP. PDA Test Notes. TOTAL DOSE BIAS CIRCUIT
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RH1021-10
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1, Final Electrical Test Requirements (Method 5004) 1*, 2, 3, 4 tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1, 2, 3, 4 5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after Group B and D for Class S and 1, 2, 3 burn-in divided by the total number of devices submitted for burn-in in Group C and D for Class B that lot shall be used to determine the percent for the lot. End Point Electrical Parameters (Method 5005) Linear Technology Corporation reserves the right to test to tighter limits *PDA Applies to subgroup 1. See PDA Test Notes. than those given.
TOTAL DOSE BIAS CIRCUIT
15V VIN 0.1µF GND –15V Rev F 4 Document Outline Description Absolute Maximum Ratings Burn-In Circuits Pin Configuration Order Information Table 1: Electrical Characteristics Table 1A: Electrical Characteristics Table 2: Electrical Test Requirements Total Dose Bias Circuit Revision History Typical Performance Characteristics
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1, Final Electrical Test Requirements (Method 5004) 1*, 2, 3, 4 tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1, 2, 3, 4 5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after Group B and D for Class S and 1, 2, 3 burn-in divided by the total number of devices submitted for burn-in in Group C and D for Class B that lot shall be used to determine the percent for the lot. End Point Electrical Parameters (Method 5005) Linear Technology Corporation reserves the right to test to tighter limits *PDA Applies to subgroup 1. See PDA Test Notes. than those given.
TOTAL DOSE BIAS CIRCUIT
15V VIN 0.1µF GND –15V Rev F 4 Document Outline Description Absolute Maximum Ratings Burn-In Circuits Pin Configuration Order Information Table 1: Electrical Characteristics Table 1A: Electrical Characteristics Table 2: Electrical Test Requirements Total Dose Bias Circuit Revision History Typical Performance Characteristics