Datasheet RH1959 MILDICE (Analog Devices) - 2

DICE/DWF SPECIFICATION RH1959MILDICE
DICE/DWF ELECTRICAL TEST LIMITS For non-specified test conditions, TA = 25°C, TJ = 25°C, VIN = 5V, VC = 1.5V, Boost = VIN + 5V, switch open. (Note 2) PARAMETER CONDITIONS MIN MAX UNITS
Feedback Voltage (Adjustable) All Conditions 1.19 1.23 V Reference Voltage Line Regulation 4.3V ≤ VIN ≤15V –0.03 0.03 %/V Feedback Input Bias Current –0.5 0.5 µA Error Amplifier Voltage Gain (Note 3) 200 Error Amplifier Transconductance (Note 9) DI (VC) = ±10mA 1500 2700 mMho Error Amplifier Source Current VFB = 1.05V 140 320 mA Error Amplifier Sink Current VFB = 1.35V VFB = 1.35V 140 320 mA Switch Current Limit (Note 9) VC Open, VFB = 1.05V, DC ≤ 50% 4.5 8.5 A Switch On Resistance (Notes 8, 9) ISW = 4.5A 0.1 Ω Maximum Switch Duty Cycle VFB = 1.05V VFB = 1.05V 90 % Switch Frequency VC Set to Give 50% Duty Cycle 460 540 kHz Switch Frequency Line Regulation 4.3V ≤ VIN ≤ 15V –0.15 0.15 %/V Frequency Shifting Threshold on FB Pin Df = 10kHz 0.5 1 V Minimum Input Voltage (Note 4) 4.3 V Minimum Boost Voltage (Notes 5, 9) ISW ≤ 4.5A 3 V Boost Current (Notes 6, 9) ISW = 1A 35 mA ISW = 4.5A 140 mA Input Supply Current (Note 7) 5.4 mA Shutdown Supply Current VSHDN = 0V, VSW = 0V, VC Open 50 µA Lockout Threshold VC Open, VFB = 1.05V, DC ≤ 50% 2.3 2.46 V Shutdown Thresholds VC Open Device Shutting Down 0.13 0.6 V Device Starting Up 0.25 0.7 V Synchronization Threshold 2.2 V Synchronizing Range 580 1000 kHz
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings constant. Actual minimum input voltage to maintain a regulated output will may cause permanent damage to the device. Exposure to any Absolute depend on output voltage and load current. Maximum Rating condition for extended periods may affect device
Note 5:
This is the minimum voltage across the boost capacitor needed to reliability and lifetime. guarantee full saturation of the internal power switch.
Note 2:
Dice are probe tested at 25°C to the limits shown except for high
Note 6:
Boost current is the current flowing into the boost pin with the pin current tests. Dice are tested under low current conditions which assure held 5V above input voltage. It flows only during switch on time. full load current specifications when assembled in packaging systems
Note 7:
Input supply current is the bias current drawn by the input pin approved by Linear Technology. with switching disabled.
Note 3:
Gain is measured with a VC swing equal to 200mV above the
Note 8:
Switch on resistance is calculated by dividing V switching threshold level to 200mV below the upper clamp level. IN to VSW voltage by the forced current (4.5A).
Note 4:
Minimum input voltage is not measured directly, but is guaranteed
Note 9:
This parameter is not measured directly, but is guaranteed by by other tests. It is defined as the voltage where internal bias lines are still design. regulated so that the reference voltage and oscillator frequency remain Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information on dice performance and lot qualifications via lot sampling test procedures. Dice data sheet subject to change. Please consult factory for current revision in production. I.D.No. 66-13-3415 2 Linear Technology Corporation LT 0814 • PRINTED IN USA 1630 McCarthy Blvd., Milpitas, CA 95035-7417 (408) 432-1900 ● FAX: (408) 434-0507 ● www.linear.com LINEAR TECHNOLOGY CORPORATION 2014