Datasheet RH108A (Analog Devices) - 3
| Fabricante | Analog Devices |
| Descripción | Operational Amplifier |
| Páginas / Página | 4 / 3 — TABLE 2: ELECTRICAL TEST REQUIREMENTS. MIL-STD-883 TEST REQUIREMENTS. … |
| Formato / tamaño de archivo | PDF / 71 Kb |
| Idioma del documento | Inglés |
TABLE 2: ELECTRICAL TEST REQUIREMENTS. MIL-STD-883 TEST REQUIREMENTS. SUBGROUP. PDA Test Notes. TOTAL DOSE BIAS CIRCUIT
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RH108A
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1, Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5,6 tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3,4,5,6 5004 of MIL-STD-883 Class B. The verified failures (including Delta Group C and D End Point Electrical Parameters 1 parameters) of group A, subgroup 1, after burn-in divided by the total (Method 5005) number of devices submitted for burn-in in that lot shall be used to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given.
TOTAL DOSE BIAS CIRCUIT
10k 15V 0.1μF 7 30pF 2 – 1 8 6 10k 3 8V + 4 0.1μF –15V RH108A TDBC
REVISION HISTORY (Revision history begins at Rev C) REV DATE DESCRIPTION PAGE NUMBER
C 11/10 Note 4 revised and added to Power Supply Rejection Ratio. 2 rh108afc Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representa- tion that the interconnection of its circuits as described herein will not infringe on existing patent rights. 3
TABLE 2: ELECTRICAL TEST REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes
The PDA is specified as 5% based on failures from group A, subgroup 1, Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5,6 tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3,4,5,6 5004 of MIL-STD-883 Class B. The verified failures (including Delta Group C and D End Point Electrical Parameters 1 parameters) of group A, subgroup 1, after burn-in divided by the total (Method 5005) number of devices submitted for burn-in in that lot shall be used to determine the percent for the lot. *PDA applies to subgroup 1. See PDA Test Notes. Linear Technology Corporation reserves the right to test to tighter limits than those given.
TOTAL DOSE BIAS CIRCUIT
10k 15V 0.1μF 7 30pF 2 – 1 8 6 10k 3 8V + 4 0.1μF –15V RH108A TDBC
REVISION HISTORY (Revision history begins at Rev C) REV DATE DESCRIPTION PAGE NUMBER
C 11/10 Note 4 revised and added to Power Supply Rejection Ratio. 2 rh108afc Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representa- tion that the interconnection of its circuits as described herein will not infringe on existing patent rights. 3