Datasheet LT1001 (Analog Devices) - 7
| Fabricante | Analog Devices |
| Descripción | Precision Operational Amplifier |
| Páginas / Página | 16 / 7 — APPLICATIONS INFORMATION. Offset Voltage Adjustment. 0.1Hz to 10Hz Noise … |
| Formato / tamaño de archivo | PDF / 202 Kb |
| Idioma del documento | Inglés |
APPLICATIONS INFORMATION. Offset Voltage Adjustment. 0.1Hz to 10Hz Noise Test Circuit. Improved Sensitivity Adjustment
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LT1001
U U W U APPLICATIONS INFORMATION Offset Voltage Adjustment
adjusted to 300 µV, the change in drift will be 1 µV/°C. The adjustment range with a 10k or 20k pot is approximately The input offset voltage of the LT1001, and its drift with ±2.5mV. If less adjustment range is needed, the sensitivity temperature, are permanently trimmed at wafer test to a and resolution of the nulling can be improved by using a low level. However, if further adjustment of Vos is neces- smaller pot in conjunction with fixed resistors. The ex- sary, nulling with a 10k or 20k potentiometer will not ample below has an approximate null range of ±100 µV. degrade drift with temperature. Trimming to a value other than zero creates a drift of (Vos/300)µV/°C, e.g., if Vos is
0.1Hz to 10Hz Noise Test Circuit
0.1µF
Improved Sensitivity Adjustment
VOLTAGE GAIN = 50,000 7.5k 100kΩ (PEAK-TO-PEAK NOISE MEASURED IN 10 SEC INTERVAL) 1k +15V 10Ω – 2kΩ 1 7.5k LT1001 + 22µF 2 – + 4.3k 8 LT1001 SCOPE 7 4.7 µF INPUT LT1001 OUTPUT – × 1 6 DEVICE 3 + R UNDER 100k 2.2µF IN = 1MΩ 4 TEST –15V 1001 F02 110k 0.1 µF 24.3k 1001 F03 The device under test should be warmed up for three minutes and shielded from air currents.
DC Stabilized 1000v/
µ
sec Op Amp
2.2µF +15V TANTALUM + 3.9k 300Ω 0.1µF 1N914 200 2N5486 Ω* 200pF 2N5160 0.01µF 22µF TANTALUM + 2N3866 33Ω 1k 2N4440 30k 1.8k RIN –15V 1k 10k 3 INPUT + 6 15pF LT1001 0.001µF 390Ω 2N3904 2 – 2N3904 0.5Ω 30k 470Ω OUTPUT 0.5Ω 22Ω 2N5160 2N3906 0.01µF 2N3866 2N4440 200pF 22µF TANTALUM – + 3.9k 1.2k 200Ω* 15-60pF TUSONIX # 519-3188 1N914 300Ω 0.1µF –15V 1001 F04 1k FULL POWER *ADJUST FOR Rf BANDWIDTH 8MHz BEST SQUARE WAVE AT OUTPUT 1001fb 7
U U W U APPLICATIONS INFORMATION Offset Voltage Adjustment
adjusted to 300 µV, the change in drift will be 1 µV/°C. The adjustment range with a 10k or 20k pot is approximately The input offset voltage of the LT1001, and its drift with ±2.5mV. If less adjustment range is needed, the sensitivity temperature, are permanently trimmed at wafer test to a and resolution of the nulling can be improved by using a low level. However, if further adjustment of Vos is neces- smaller pot in conjunction with fixed resistors. The ex- sary, nulling with a 10k or 20k potentiometer will not ample below has an approximate null range of ±100 µV. degrade drift with temperature. Trimming to a value other than zero creates a drift of (Vos/300)µV/°C, e.g., if Vos is
0.1Hz to 10Hz Noise Test Circuit
0.1µF
Improved Sensitivity Adjustment
VOLTAGE GAIN = 50,000 7.5k 100kΩ (PEAK-TO-PEAK NOISE MEASURED IN 10 SEC INTERVAL) 1k +15V 10Ω – 2kΩ 1 7.5k LT1001 + 22µF 2 – + 4.3k 8 LT1001 SCOPE 7 4.7 µF INPUT LT1001 OUTPUT – × 1 6 DEVICE 3 + R UNDER 100k 2.2µF IN = 1MΩ 4 TEST –15V 1001 F02 110k 0.1 µF 24.3k 1001 F03 The device under test should be warmed up for three minutes and shielded from air currents.
DC Stabilized 1000v/
µ
sec Op Amp
2.2µF +15V TANTALUM + 3.9k 300Ω 0.1µF 1N914 200 2N5486 Ω* 200pF 2N5160 0.01µF 22µF TANTALUM + 2N3866 33Ω 1k 2N4440 30k 1.8k RIN –15V 1k 10k 3 INPUT + 6 15pF LT1001 0.001µF 390Ω 2N3904 2 – 2N3904 0.5Ω 30k 470Ω OUTPUT 0.5Ω 22Ω 2N5160 2N3906 0.01µF 2N3866 2N4440 200pF 22µF TANTALUM – + 3.9k 1.2k 200Ω* 15-60pF TUSONIX # 519-3188 1N914 300Ω 0.1µF –15V 1001 F04 1k FULL POWER *ADJUST FOR Rf BANDWIDTH 8MHz BEST SQUARE WAVE AT OUTPUT 1001fb 7