Datasheet RH37C (Analog Devices) - 4
| Fabricante | Analog Devices |
| Descripción | Precision Operational Amplifier |
| Páginas / Página | 4 / 4 — W U. TYPICAL PERFOR A CE CHARACTERISTICS. Input Offset Voltage. Open-Loop … |
| Formato / tamaño de archivo | PDF / 165 Kb |
| Idioma del documento | Inglés |
W U. TYPICAL PERFOR A CE CHARACTERISTICS. Input Offset Voltage. Open-Loop Gain. Input Bias Current. Common Mode Rejection Ratio
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RH37C
W U TYPICAL PERFOR A CE CHARACTERISTICS Input Offset Voltage Open-Loop Gain Input Bias Current
150 170 350 VS = ±15V VS = ±15V VS = ±15V V 100 VCM = 0V 160 RL = 2k 300 CM = 0V VOUT = ±10V µV) 50 150 250 0 140 200 –50 130 150 –100 120 OPEN-LOOP GAIN (dB) 100 INPUT BIAS CURRENT (nA) INPUT OFFSET VOLTAGE ( –150 110 50 –200 100 0 1 10 100 1000 1 10 100 1000 1 10 100 1000 TOTAL DOSE KRAD (Si) TOTAL DOSE KRAD (Si) TOTAL DOSE KRAD (Si) RH37C G03 RH37C G04 RH37C G05
Common Mode Rejection Ratio Input Offset Current Power Supply Rejection Ratio
170 75 140 V V S = ±15V S = ±15V VS = ±4V TO ±18V V V CM = ±11V CM = 0V 160 130 50 150 120 25 140 110 130 0 100 120 90 INPUT OFFSET CURRENT (nA) –25 110 80 COMMON MODE REJECTION RATIO (dB) POWER SUPPLY REJECTION RATIO (dB) 100 –50 70 1 10 100 1000 1 10 100 1000 1 10 100 1000 TOTAL DOSE KRAD (Si) TOTAL DOSE KRAD (Si) TOTAL DOSE KRAD (Si) RH37C G06 RH37C G07 RH37C G08
W U TABLE 2: ELECTRICAL TEST REQUIRE E TS PDA Test Notes MIL-STD-883 TEST REQUIREMENTS SUBGROUP
The PDA is specified as 5% based on failures from group A, subgroup 1, Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5,6,7 tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3,4,5,6,7 5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup Group B and D for Class S, and 1 1, after burn-in divided by the total number of devices submitted for burn- Group C and D for Class B in in that lot shall be used to determine the percent for the lot. End Point Electrical Parameters (Method 5005) Linear Technology Corporation reserves the right to test to tighter limits than those given. * PDA applies to subgroup 1. See PDA Test Notes. I.D. No. 66-10-0172 Rev. B 0398 rh37cb LT/HP 0398 100 REV B • PRINTED IN USA 4 Linear Technology Corporation 1630 McCarthy Blvd., Milpitas, CA 95035-7417 ● (408) 432-1900 FAX: (408) 434-0507 ● TELEX: 499-3977 ● www.linear-tech.com LINEAR TECHNOLOGY CORPORATION 1993
W U TYPICAL PERFOR A CE CHARACTERISTICS Input Offset Voltage Open-Loop Gain Input Bias Current
150 170 350 VS = ±15V VS = ±15V VS = ±15V V 100 VCM = 0V 160 RL = 2k 300 CM = 0V VOUT = ±10V µV) 50 150 250 0 140 200 –50 130 150 –100 120 OPEN-LOOP GAIN (dB) 100 INPUT BIAS CURRENT (nA) INPUT OFFSET VOLTAGE ( –150 110 50 –200 100 0 1 10 100 1000 1 10 100 1000 1 10 100 1000 TOTAL DOSE KRAD (Si) TOTAL DOSE KRAD (Si) TOTAL DOSE KRAD (Si) RH37C G03 RH37C G04 RH37C G05
Common Mode Rejection Ratio Input Offset Current Power Supply Rejection Ratio
170 75 140 V V S = ±15V S = ±15V VS = ±4V TO ±18V V V CM = ±11V CM = 0V 160 130 50 150 120 25 140 110 130 0 100 120 90 INPUT OFFSET CURRENT (nA) –25 110 80 COMMON MODE REJECTION RATIO (dB) POWER SUPPLY REJECTION RATIO (dB) 100 –50 70 1 10 100 1000 1 10 100 1000 1 10 100 1000 TOTAL DOSE KRAD (Si) TOTAL DOSE KRAD (Si) TOTAL DOSE KRAD (Si) RH37C G06 RH37C G07 RH37C G08
W U TABLE 2: ELECTRICAL TEST REQUIRE E TS PDA Test Notes MIL-STD-883 TEST REQUIREMENTS SUBGROUP
The PDA is specified as 5% based on failures from group A, subgroup 1, Final Electrical Test Requirements (Method 5004) 1*,2,3,4,5,6,7 tests after cooldown as the final electrical test in accordance with method Group A Test Requirements (Method 5005) 1,2,3,4,5,6,7 5004 of MIL-STD-883 Class B. The verified failures of group A, subgroup Group B and D for Class S, and 1 1, after burn-in divided by the total number of devices submitted for burn- Group C and D for Class B in in that lot shall be used to determine the percent for the lot. End Point Electrical Parameters (Method 5005) Linear Technology Corporation reserves the right to test to tighter limits than those given. * PDA applies to subgroup 1. See PDA Test Notes. I.D. No. 66-10-0172 Rev. B 0398 rh37cb LT/HP 0398 100 REV B • PRINTED IN USA 4 Linear Technology Corporation 1630 McCarthy Blvd., Milpitas, CA 95035-7417 ● (408) 432-1900 FAX: (408) 434-0507 ● TELEX: 499-3977 ● www.linear-tech.com LINEAR TECHNOLOGY CORPORATION 1993