Datasheet RH6200M (Analog Devices) - 4

FabricanteAnalog Devices
DescripciónLow Noise, High Speed Rail-to-Rail Op Amp
Páginas / Página10 / 4 — TABLE 2: ELECTRICAL TEST. TOTAL DOSE BIAS CIRCUIT. REQUIREMENTS. …
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TABLE 2: ELECTRICAL TEST. TOTAL DOSE BIAS CIRCUIT. REQUIREMENTS. MIL-STD-883 TEST REQUIREMENTS. SUBGROUP. PDA Test Notes

TABLE 2: ELECTRICAL TEST TOTAL DOSE BIAS CIRCUIT REQUIREMENTS MIL-STD-883 TEST REQUIREMENTS SUBGROUP PDA Test Notes

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RH6200M
TABLE 2: ELECTRICAL TEST TOTAL DOSE BIAS CIRCUIT REQUIREMENTS
C
MIL-STD-883 TEST REQUIREMENTS SUBGROUP
F* Final Electrical Test Requirements (Method 5004) 1*, 2, 3, 4, 5, 6 Group A Test Requirements (Method 5005) 1*, 2, 3, 4, 5, 6 10k Group B and D for Class S, 1, 2, 3 5V End Point Electrical Parameters (Method 5005) *PDA applies to subgroup 1. See PDA Test Notes. –
PDA Test Notes
10k + The PDA is specified as 5% based on failures from group A, subgroup 1, tests after cooldown as the final electrical test in accordance with method 5004 of MIL-STD-883. The verified failures of group A, subgroup 1, after burn-in –5V RH6200 F02 divided by the total number of devices submitted for burn-in in that lot shall *CF IS COMPONENT OR PARASITIC be used to determine the percent for the lot. CAPACITANCE ENSURING STABILITY Linear Technology Corporation reserves the right to test to tighter limits than those given.
TYPICAL PERFORMANCE CHARACTERISTICS VOS Distribution, VCM = V+ VOS Distribution, VCM = V– Supply Current vs Supply Voltage
80 80 30 VS = 5V, 0V VS = 5V, 0V T 70 70 A = 125°C 25 60 60 20 T 50 50 A = 25°C 40 40 15 30 30 TA = –55°C NUMBER OF UNITS NUMBER OF UNITS 10 20 20 SUPPLY CURRENT (mA) 5 10 10 0 0 0 –1600–1200 –800 –400 0 400 800 1200 1600 –1600–1200 –800 –400 0 400 800 1200 1600 0 2 4 6 8 10 12 14 INPUT OFFSET VOLTAGE (μV) INPUT OFFSET VOLTAGE (μV) TOTAL SUPPLY VOLTAGE (V) RH6200 G01 RH6200 G02 RH6200 G03 rh6200mfa 4