Datasheet LT6656 (Analog Devices) - 6

LT6656
ELECTRICAL CHARACTERISTICS Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 7:
Excludes load regulation errors. may cause permanent damage to the device. Exposure to any Absolute
Note 8:
Peak-to-peak noise is measured with a 3-pole highpass filter at Maximum Rating condition for extended periods may affect device 0.1Hz and a 4-pole lowpass filter at 10Hz. The unit is enclosed in a still-air reliability and lifetime. environment to eliminate thermocouple effects on the leads. The test
Note 2:
The LT6656C is guaranteed to meet specified performance from time is 10 seconds. RMS noise is measured on a spectrum analyzer in a 0°C to 70°C. The LT6656C is designed, characterized and expected to shielded environment. meet specified performance from –40°C to 85°C but is not tested or
Note 9:
Long term stability typically has a logarithmic characteristic and QA sampled at these temperatures. The LT6656I is guaranteed to meet therefore, changes after 1000 hours tend to be much smaller than before specified performance from –40°C to 85°C. By design, the LT6656 is that time. Total drift in the second thousand hours is normally less than guaranteed functional over the operating temperature range of –55°C to one third that of the first thousand hours with a continuing trend toward 125°C. reduced drift with time. Long-term stability will also be affected by
Note 3
: If the LT6656 is stored outside of the specified temperature range, differential stresses between the IC and the board material created during the output may shift due to hysteresis. board assembly.
Note 4:
The stated temperature is typical for soldering of the leads during
Note 10:
Hysteresis in output voltage is created by mechanical stress manual rework. For detailed IR reflow recommendations, refer to the that differs depending on whether the IC was previously at a higher or Applications section. lower temperature. Output voltage is always measured at 25°C, but
Note 5:
Temperature coefficient is measured by dividing the maximum the IC is cycled to the hot or cold temperature limit before successive change in output voltage by the specified temperature range. measurements. For instruments that are stored at well controlled
Note 6:
Load regulation is measured with a pulse from no load to the temperatures (within 20 or 30 degrees of operational temperature) specified load current. Output changes due to die temperature change hysteresis is usually not a dominant error source. Typical hysteresis is the must be taken into account separately. worst-case of 25°C to cold to 25°C or 25°C to hot to 25°C, preconditioned by one thermal cycle.
TYPICAL PERFORMANCE CHARACTERISTICS Output Voltage Temperature Drift Typical VOUT Distribution Supply Current vs Input Voltage
10000 200 100 ALL OPTIONS ALL OPTIONS 1.25V OPTION TA = 125°C 9000 25 TYPICAL UNITS 180 C T L = 1µF A = 85°C NORMALIZED AT 25°C I T L = 0 A = 25°C 8000 C 160 T T L = 1µF A = 25°C A = –40°C 7000 I T L = 0 140 A = –55°C 10 TAGE (ppm) 6000 120 5000 100 4000 Y CURRENT (µA) 80 3000 1 NUMBER OF UNITS 2000 60 SUPPL 1000 40 CHANGE IN OUTPUT VOL 0 20 –1000 0 0.1 –60 –40 –20 0 20 40 60 80 100 120 –0.10 –0.06 –0.02 0 0.02 0.06 0.10 0 2 4 6 8 10 12 14 16 18 20 TEMPERATURE (°C) OUTPUT VOLTAGE ERROR (%) INPUT VOLTAGE (V) 6652 G01 6656 G02 6656 G17 6656fc 6 For more information www.linear.com/LT6656 Document Outline Features Applications Description Typical Application Absolute Maximum Ratings Pin Configuration Order Information Available Options Electrical Characteristics Typical Performance Characteristics Pin Functions Block Diagram Applications Information Typical Applications Package Description Revision History Typical Application Related Parts