Datasheet OP200 (Analog Devices) - 8

TABLE IIA. Electrical test requirements. Test requirements Subgroups Subgroups (in accordance with (in accordance with MIL-STD-883, MIL-PRF-38535, table III) method 5005, table I) Device Device Device class M class Q class V Interim electrical 1 1 1 parameters (see 4.2) Final electrical 1,2,3,4 1/ 1,2,3,4 1/ 1,2,3,4, 1/ parameters (see 4.2) 2/ Group A test 1,2,3,4, 1,2,3,4 1,2,3,4 requirements (see 4.4) Group C end-point electrical 1 1 1 2/ parameters (see 4.4) Group D end-point electrical 1 1 1 parameters (see 4.4) Group E end-point electrical ---- ---- ---- parameters (see 4.4) 1/ PDA applies to subgroup 1. 2/ Delta limits as specified in table IIB shall be required where specified, and the delta limits shall be computed with reference to the previous endpoint electrical parameters. Table IIB. 240 hour burn-in and group C end-point electrical parameters. TA = +25°C Test Limit Delta Min Max Min Max Units VIO -75 75 -50 50 µV ±IIB -2 2 -1.5 1.5 nA 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein. 4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883: a. Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883. b. TA = +125°C, minimum. c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
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5962-88593 MICROCIRCUIT DRAWING A
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990 F 8 DSCC FORM 2234 APR 97 Document Outline DEPARTMENT OF DEFENSE SPECIFICATION DEPARTMENT OF DEFENSE STANDARDS