Datasheet AD844 (Analog Devices) - 9

FabricanteAnalog Devices
Descripción60 MHz, 2000 V/μs, Monolithic Op Amp with Quad Low Noise
Páginas / Página12 / 9 — STANDARD. 5962-89644. MICROCIRCUIT DRAWING
Formato / tamaño de archivoPDF / 75 Kb
Idioma del documentoInglés

STANDARD. 5962-89644. MICROCIRCUIT DRAWING

STANDARD 5962-89644 MICROCIRCUIT DRAWING

Línea de modelo para esta hoja de datos

Versión de texto del documento

TABLE IIA. Electrical test requirements. Test requirements Subgroups Subgroups (in accordance with (in accordance with MIL-STD-883, MIL-PRF-38535, table III) method 5005, table I) Device Device Device class M class Q class V Interim electrical 1 1 1 parameters (see 4.2) Final electrical 1,2,3,4,5,6 1/ 2/ 1,2,3, 1/ 2/ 1,2,3, 1/ 2/ 3/ parameters (see 4.2) 4,5,6 4,5,6 Group A test 1,2,3,4,5,6 2/ 1,2,3,4,5,6 2/ 1,2,3,4,5,6 2/ requirements (see 4.4) Group C end-point electrical 1 1 1 3/ parameters (see 4.4) Group D end-point electrical 1 1 1 parameters (see 4.4) Group E end-point electrical 1 1 1 parameters (see 4.4) 1/ PDA applies to subgroup 1. VOS, IOS, and deltas excluded from PDA. 2/ Subgroup 4, 5, and 6 if not tested, shall be guaranteed to the limits specified in table I herein. 3/ Delta limits as specified in table IIB shall be required where specified, and delta limits shall be computed with reference to the previous endpoint electrical parameters. TABLE IIB. Burn-in and operating life test delta parameters. TA = +25C. Test Symbol End point Delta Input offset voltage VOS 300 V 150 V 4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified. Quality conformance inspection for device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4.1 Group A inspection. a. Tests shall be as specified in table IIA herein. b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted.
STANDARD
SIZE
5962-89644 MICROCIRCUIT DRAWING A
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990
E 9
DSCC FORM 2234 APR 97