Datasheet OP467 (Analog Devices)

REVISIONS LTR DESCRIPTION DATE (YR-MO-DA) APPROVED A Change to the supply current test, ICC, in table I. Update boilerplate. - rrp 99-11-16 R. MONNIN B Add radiation hardness requirements. Add case outline D. Add table IIB. - rrp 00-05-05 R. MONNIN Add footnote to the supply voltage test in section 1.3. Add footnote to the C supply current and power supply rejection ratio test in table I. Update 01-10-17 R. MONNIN boilerplate. – rrp Change to the post irradiation test limits in table I for IIO, IIB, AVO, and ICC. D Removed accelerated aging and dose rate burnout provisions in 01-11-15 R. MONNIN section 4. – rrp E Added subgroup 4 to table IIA under group E end-point for device class V. – gt 03-03-11 R. MONNIN F Drawing updated to reflect current requirements. - rrp 05-09-07 R. MONNIN Delete footnote 2/ from section 1.3. Delete footnote 5/ from Table I. G 10-04-22 C. SAFFLE These footnotes were incorrectly added under revision C. - ro Add footnote 4/ to the Large signal voltage gain (AVO) test under the condition H column with VCC = 5 V as specified in Table I. Delete figure 2 radiation 14-12-08 C.SAFFLE exposure circuit. Make change to paragraph 3.2.3. - ro Delete footnote 4/ from the Output voltage swing test under the condition J 15-04-08 C. SAFFLE column with VCC = 15 V as specified in Table I. - ro REV SHEET REV SHEET REV STATUS REV J J J J J J J J J J J OF SHEETS SHEET 1 2 3 4 5 6 7 8 9 10 11 PMIC N/A PREPARED BY RICK C. OFFICER
DLA LAND AND MARITIME COLUMBUS, OHIO 43218-3990 STANDARD
CHECKED BY
http://www.landandmaritime.dla.mil MICROCIRCUIT
RAJESH R. PITHADIA
DRAWING
APPROVED BY THIS DRAWING IS AVAILABLE MICHAEL A. FRYE MICROCIRCUIT, LINEAR, RADIATION FOR USE BY ALL HARDENED, PRECISION, HIGH SPEED, QUAD DEPARTMENTS DRAWING APPROVAL DATE OPERATIONAL AMPLIFIER, MONOLITHIC AND AGENCIES OF THE DEPARTMENT OF DEFENSE 94-03-02 SILICON REVISION LEVEL SIZE CAGE CODE AMSC N/A
5962-93258
J A
67268
SHEET 1 OF 11 DSCC FORM 2233 APR 97 5962-E182-15