Datasheet CD4070BMS, CD4077BMS (Intersil) - 5
| Fabricante | Intersil |
| Descripción | CMOS Quad Exclusive OR and Exclusive NOR Gates |
| Páginas / Página | 8 / 5 — TABLE 6. APPLICABLE SUBGROUPS (Continued). MIL-STD-883. CONFORMANCE … |
| Revisión | 2017-12-22 |
| Formato / tamaño de archivo | PDF / 271 Kb |
| Idioma del documento | Inglés |
TABLE 6. APPLICABLE SUBGROUPS (Continued). MIL-STD-883. CONFORMANCE GROUP. METHOD. GROUP A SUBGROUPS. READ AND RECORD
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CD4070BMS, CD4077BMS
TABLE 6. APPLICABLE SUBGROUPS (Continued) MIL-STD-883 CONFORMANCE GROUP METHOD GROUP A SUBGROUPS READ AND RECORD
PDA (Note 1) 100% 5004 1, 7, 9, Deltas Final Test 100% 5004 2, 3, 8A, 8B, 10, 11 Group A Sample 5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11 Group B Subgroup B-5 Sample 5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas Subgroups 1, 2, 3, 9, 10, 11 Subgroup B-6 Sample 5005 1, 7, 9 Group D Sample 5005 1, 2, 3, 8A, 8B, 9 Subgroups 1, 2 3 NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 7. TOTAL DOSE IRRADIATION TEST READ AND RECORD MIL-STD-883 CONFORMANCE GROUPS METHOD PRE-IRRAD POST-IRRAD PRE-IRRAD POST-IRRAD
Group E Subgroup 2 5005 1, 7, 9 Table 4 1, 9 Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS OSCILLATOR FUNCTION OPEN GROUND VDD 9V
-0.5V 50kHz 25kHz
Static Burn-In 1 3, 4, 10, 11 1, 2, 5-9, 12, 13 14 Note 1 Static Burn-In 2 3, 4, 10, 11 7 1, 2, 5, 6, 8, Note 1 9, 12-14 Dynamic Burn- - 7 14 3, 4, 10, 11 1, 5, 8, 12 2, 6, 9, 13 In Note 1 Irradiation 3, 4, 10, 11 7 1, 2, 5, 6, 8, Note 2 9, 12-14 NOTE: 1. Each pin except VDD and GND will have a series resistor of 10K 5%, VDD = 18V 0.5V 2. Each pin except VDD and GND will have a series resistor of 47K 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD = 10V 0.5V © Copyright Intersil Americas LLC 1999. All Rights Reserved. All trademarks and registered trademarks are the property of their respective owners. For additional products, see www.intersil.com/en/products.html Intersil products are manufactured, assembled and tested utilizing ISO9001 quality systems as noted in the quality certifications found at www.intersil.com/en/support/qualandreliability.html Intersil products are sold by description only. Intersil may modify the circuit design and/or specifications of products at any time without notice, provided that such modification does not, in Intersil's sole judgment, affect the form, fit or function of the product. Accordingly, the reader is cautioned to verify that datasheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see www.intersil.com FN3322 Rev 0.00 Page 5 of 8 December 1992
TABLE 6. APPLICABLE SUBGROUPS (Continued) MIL-STD-883 CONFORMANCE GROUP METHOD GROUP A SUBGROUPS READ AND RECORD
PDA (Note 1) 100% 5004 1, 7, 9, Deltas Final Test 100% 5004 2, 3, 8A, 8B, 10, 11 Group A Sample 5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11 Group B Subgroup B-5 Sample 5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas Subgroups 1, 2, 3, 9, 10, 11 Subgroup B-6 Sample 5005 1, 7, 9 Group D Sample 5005 1, 2, 3, 8A, 8B, 9 Subgroups 1, 2 3 NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 7. TOTAL DOSE IRRADIATION TEST READ AND RECORD MIL-STD-883 CONFORMANCE GROUPS METHOD PRE-IRRAD POST-IRRAD PRE-IRRAD POST-IRRAD
Group E Subgroup 2 5005 1, 7, 9 Table 4 1, 9 Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS OSCILLATOR FUNCTION OPEN GROUND VDD 9V
-0.5V 50kHz 25kHz
Static Burn-In 1 3, 4, 10, 11 1, 2, 5-9, 12, 13 14 Note 1 Static Burn-In 2 3, 4, 10, 11 7 1, 2, 5, 6, 8, Note 1 9, 12-14 Dynamic Burn- - 7 14 3, 4, 10, 11 1, 5, 8, 12 2, 6, 9, 13 In Note 1 Irradiation 3, 4, 10, 11 7 1, 2, 5, 6, 8, Note 2 9, 12-14 NOTE: 1. Each pin except VDD and GND will have a series resistor of 10K 5%, VDD = 18V 0.5V 2. Each pin except VDD and GND will have a series resistor of 47K 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD = 10V 0.5V © Copyright Intersil Americas LLC 1999. All Rights Reserved. All trademarks and registered trademarks are the property of their respective owners. For additional products, see www.intersil.com/en/products.html Intersil products are manufactured, assembled and tested utilizing ISO9001 quality systems as noted in the quality certifications found at www.intersil.com/en/support/qualandreliability.html Intersil products are sold by description only. Intersil may modify the circuit design and/or specifications of products at any time without notice, provided that such modification does not, in Intersil's sole judgment, affect the form, fit or function of the product. Accordingly, the reader is cautioned to verify that datasheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries. For information regarding Intersil Corporation and its products, see www.intersil.com FN3322 Rev 0.00 Page 5 of 8 December 1992