Datasheet LT1160, LT1162 (Analog Devices) - 3

FabricanteAnalog Devices
DescripciónHalf-/Full-Bridge N-Channel Power MOSFET Drivers
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ELECTRICAL CHARACTERISTICS The. denotes the specifications which apply over the full operating

ELECTRICAL CHARACTERISTICS The denotes the specifications which apply over the full operating

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LT1160/LT1162
ELECTRICAL CHARACTERISTICS The

denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25
°
C.Test Circuit, TA = 25
°
C, V+ = VBOOST = 12V, VTSOURCE = 0V, CGATE = 3000pF. Gate Feedback pins connected to Gate Drive pins, unless otherwise specified. SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
IUVOUT Undervoltage Output Leakage V + = 15V ● 0.1 5 µA VUVOUT Undervoltage Output Saturation V + = 7.5V, IUVOUT = 2.5mA ● 0.2 0.4 V VOH Top Gate ON Voltage VINTOP = 2V, VINBOTTOM = 0.8V ● 11 11.3 12 V Bottom Gate ON Voltage VINTOP = 0.8V, VINBOTTOM = 2V ● 11 11.3 12 V VOL Top Gate OFF Voltage VINTOP = 0.8V, VINBOTTOM = 2V ● 0.4 0.7 V Bottom Gate OFF Voltage VINTOP = 2V, VINBOTTOM = 0.8V ● 0.4 0.7 V tr Top Gate Rise Time VINTOP (+) Transition, VINBOTTOM = 0.8V, ● 130 200 ns Measured at VTGATE DR (Note 5) Bottom Gate Rise Time VINBOTTOM (+) Transition, VINTOP = 0.8V, ● 90 200 ns Measured at VBGATE DR (Note 5) tf Top Gate Fall Time VINTOP (–) Transition, VINBOTTOM = 0.8V, ● 60 140 ns Measured at VTGATE DR (Note 5) Bottom Gate Fall Time VINBOTTOM (–) Transition, VINTOP = 0.8V, ● 60 140 ns Measured at VBGATE DR (Note 5) tD1 Top Gate Turn-On Delay VINTOP (+) Transition, VINBOTTOM = 0.8V, ● 250 500 ns Measured at VTGATE DR (Note 5) Bottom Gate Turn-On Delay VINBOTTOM (+) Transition, VINTOP = 0.8V, ● 200 400 ns Measured at VBGATE DR (Note 5) tD2 Top Gate Turn-Off Delay VINTOP (–) Transition, VINBOTTOM = 0.8V, ● 300 600 ns Measured at VTGATE DR (Note 5) Bottom Gate Turn-Off Delay VINBOTTOM (–) Transition, VINTOP = 0.8V, ● 200 400 ns Measured at VBGATE DR (Note 5) tD3 Top Gate Lockout Delay VINBOTTOM (+) Transition, VINTOP = 2V, ● 300 600 ns Measured at VTGATE DR (Note 5) Bottom Gate Lockout Delay VINTOP (+) Transition, VINBOTTOM = 2V, ● 250 500 ns Measured at VBGATE DR (Note 5) tD4 Top Gate Release Delay VINBOTTOM (–) Transition, VINTOP = 2V, ● 250 500 ns Measured at VTGATE DR (Note 5) Bottom Gate Release Delay VINTOP (–) Transition, VINBOTTOM = 2V, ● 200 400 ns Measured at VBGATE DR (Note 5)
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 4:
IS is the sum of currents through SV +, PV + and Boost pins. may cause permanent damage to the device. Exposure to any Absolute IBOOST is the current through the Boost pin. Dynamic supply current is Maximum Rating condition for extended periods may affect device higher due to the gate charge being delivered at the switching frequency. reliability and lifetime. See Typical Performance Characteristics and Applications Information
Note 2:
For the LT1160, Pins 1, 10 should be connected together. For the sections. The LT1160 = 1/2 LT1162. LT1162, Pins 1, 7, 14, 20 should be connected together.
Note 5:
See Timing Diagram. Gate rise times are measured from 2V to 10V
Note 3:
T and fall times are measured from 10V to 2V. Delay times are measured J is calculated from the ambient temperature TA and power dissipation P from the input transition to when the gate voltage has risen to 2V or D according to the following formulas: LT1160CN/LT1160IN: T decreased to 10V. J = TA + (PD)(70°C/W) LT1160CS/LT1160IS: TJ = TA + (PD)(110°C/W) LT1162CN/LT1162IN: TJ = TA + (PD)(58°C/W) LT1162CS/LT1162IS: TJ = TA + (PD)(80°C/W) 11602fb 3