Datasheet ADIS16135 (Analog Devices) - 4

Data Sheet ADIS16135 SPECIFICATIONS
TA = 25°C, VCC = 5.0 V, angular rate = 0°/sec, dynamic range = ±300°/sec ± 1 g, unless otherwise noted.
Table 1. Parameter Test Conditions/Comments Min Typ Max Unit
GYROSCOPES Dynamic Range ±300 ±350 °/sec Initial Sensitivity GYRO_OUT register only 0.0125 °/sec/LSB Repeatability1 −40°C ≤ TA ≤ +85°C ±1 % Sensitivity Temperature Coefficient −40°C ≤ TA ≤ +85°C ±16 ppm/°C Nonlinearity Best fit straight line ±0.008 % of FS Bias Repeatability1, 2 −40°C ≤ TA ≤ +85°C, 1 σ ±1 °/sec In-Run Bias Stability +25°C, SMPL_PRD = 0x001F 0.0017 °/sec Angular Random Walk 1 σ, +25°C 0.75 °/√hr Linear Acceleration Effect on Bias 1 σ 0.03 °/sec/g Bias Voltage Sensitivity VCC = 4.85 V to 5.15 V 0.02 °/sec/V Output Noise SMPL_PRD = 0x001F 0.27 °/sec rms Rate Noise Density f = 25 Hz, SMPL_PRD = 0x001F 0.0122 °/sec/√Hz rms 3 dB Bandwidth 335 Hz Sensor Resonant Frequency 14.5 kHz LOGIC INPUTS3 Input High Voltage, VIH 2.0 V Input Low Voltage, VIL 0.8 V Logic 1 Input Current, IIH VIH = 3.3 V ±0.2 ±1 µA Logic 0 Input Current, IIL VIL = 0 V All Pins Except RST 40 60 μA RST Pin 80 μA Input Capacitance, CIN 10 pF DIGITAL OUTPUTS3 Output High Voltage, VOH ISOURCE = 1.6 mA 2.4 V Output Low Voltage, VOL ISINK = 1.6 mA 0.4 V FLASH MEMORY Endurance4 10,000 Cycles Data Retention4 TJ = 85°C 20 Years FUNCTIONAL TIMES5 Time until data is available Power-On Start-Up Time 181 ms Reset Recovery Time 74 ms Sleep Mode Recovery Time 4.7 ms Flash Memory Self-Test SMPL_PRD = 0x000F 16 ms Automatic Sensor Self-Test Time SMPL_PRD = 0x000F 46 ms CONVERSION RATE 680 2048 SPS Clock Accuracy SMPL_PRD = 0x001F ±3 % Sync Input Clock SMPL_PRD = 0x0000 6806 2048 Hz POWER SUPPLY Operating voltage range, VCC 4.85 5.0 5.25 V Power Supply Current SMPL_PRD = 0x001F 88 mA Sleep mode 1.4 mA 1 The Repeatability specifications represent analytical projections, which are based off of the fol owing drift contributions and conditions: temperature hysteresis (−40°C to +85°C), electronics drift (High-Temperature Operating Life test: +85°C, 500 hours), drift from temperature cycling (JESD22, Method A104-C, Method N, 500 cycles, −40°C to +85°C), rate random walk (10 year projection), and broadband noise 2 Bias repeatability describes a long-term behavior, over a variety of conditions. Short-term repeatability is related to the in-run bias stability and noise density specifications. 3 The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant. 4 JEDEC Standard 22, Method A117. Endurance measured at −40°C, +25°C, +85°C, and +125°C. 5 These times do not include thermal settling and internal filter response times (340 Hz bandwidth), which may affect overall accuracy. 6 The sync input clock and internal sampling clock function below the specified minimum value, at reduced performance levels. Rev. F | Page 3 of 20 Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Timing Specifications Timing Diagrams Absolute Maximum Ratings ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Basic Operation Reading Sensor Data Output Data Registers Rotation Rate (Gyroscope) Internal Temperature Dual Memory Structure User Registers Digital Processing Configuration Internal Sample Rate Input Clock Configuration Digital Filtering Averaging/Decimation Filter Calibration Automatic Bias Correction Manual Bias Correction Alarms Static Alarm Use Dynamic Alarm Use Alarm Reporting Alarm Example System Controls Global Commands Software Reset Memory Management Checksum Test General-Purpose I/O Data Ready I/O Indicator Example I/O Configuration Self-Test Power Management Status Product Identification Applications Information Breakout Board Installation Tips Outline Dimensions Ordering Guide