Datasheet ADIS16136 (Analog Devices) - 4
| Fabricante | Analog Devices |
| Descripción | ±450°/Sec Precision Angular Rate Sensor |
| Páginas / Página | 21 / 4 — Data Sheet. ADIS16136. SPECIFICATIONS. Table 1. Parameter. Test … |
| Revisión | D |
| Formato / tamaño de archivo | PDF / 490 Kb |
| Idioma del documento | Inglés |
Data Sheet. ADIS16136. SPECIFICATIONS. Table 1. Parameter. Test Conditions/Comments. Min. Typ. Max. Unit
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Data Sheet ADIS16136 SPECIFICATIONS
TA = 25°C, VDD = 5.0 V, angular rate = 0°/sec, dynamic range = ±450°/sec, ±1 g, unless otherwise noted.
Table 1. Parameter Test Conditions/Comments Min Typ Max Unit
GYROSCOPES Dynamic Range ±450 ±480 °/sec Sensitivity GYRO_OUT, GYRO_OUT2 (24 bits) 7.139x10−5 °/sec/LSB Repeatability1 −40°C ≤ TA ≤ +70°C ±1 % Sensitivity Temperature Coefficient −40°C ≤ TA ≤ +70°C, 1 σ ±35 ppm/°C Nonlinearity Best fit straight line, ±400°/sec ±0.01 % of FS Bias Repeatability1, 2 −40°C ≤ TA ≤ +70°C, 1 σ ±0.15 °/sec Bias Temperature Coefficient −40°C ≤ TA ≤ +70°C, 1 σ ±0.00125 °/sec/°C In-Run Bias Stability 25°C, SMPL_PRD = 0x000F 4 °/hr Angular Random Walk 1 σ, 25°C 0.167 °/√hr Linear Acceleration Effect on Bias 1 σ 0.017 °/sec/g Bias Voltage Sensitivity VDD = 4.75 V to 5.25 V, 1 σ ±0.08 °/sec/V Misalignment Axis-to-frame (package) ±1.0 Degrees Output Noise No filtering 0.11 °/sec rms Rate Noise Density f = 25 Hz, no filtering 0.00357 °/sec/√Hz rms 3 dB Bandwidth 380 Hz Sensor Resonant Frequency 15.5 17.5 20 kHz LOGIC INPUTS3 Input High Voltage, VIH 2.0 V Input Low Voltage, VIL 0.8 V Logic 1 Input Current, IIH VIH = 3.3 V ±0.2 ±1 µA Logic 0 Input Current, IIL VIL = 0 V All Pins Except RST 40 60 μA RST Pin 80 μA Input Capacitance, CIN 10 pF DIGITAL OUTPUTS3 Output High Voltage, VOH ISOURCE = 1.6 mA 2.4 V Output Low Voltage, VOL ISINK = 1.6 mA 0.4 V FLASH MEMORY Endurance4 10,000 Cycles Data Retention4 TJ = 85°C 20 Years FUNCTIONAL TIMES5 Time until data is available Power-On Start-Up Time 245 ms Reset Recovery Time 128 ms Sleep Mode Recovery Time 2.5 ms Flash Memory Update 72 ms Flash Memory Self Test 21 ms Automatic Sensor Self Test Time SMPL_PRD ≠ 0x0000 245 ms SAMPLE RATE 6806 2048 SPS Internal Sample Rate Accuracy SMPL_PRD = 0x000F ±3 % Input Sync Clock Range SMPL_PRD = 0x0000 6806 2048 Hz POWER SUPPLY Operating voltage range, VDD 4.75 5.0 5.25 V Power Supply Current SMPL_PRD = 0x001F 120 mA Sleep mode 1.4 mA 1 The Repeatability specifications represent analytical projections, which are based off of the following drift contributions and conditions: temperature hysteresis (−40°C to +70°C), electronics drift (High-Temperature Operating Life test: +85°C, 500 hours), drift from temperature cycling (JESD22, Method A104-C, Method N, 500 cycles, −40°C to +85°C), rate random walk (10 year projection), and broadband noise 2 Bias repeatability describes a long-term behavior, over a variety of conditions. Short-term repeatability is related to the in-run bias stability and noise density specifications. 3 The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant. 4 JEDEC Standard 22, Method A117. Endurance measured at −40°C, +25°C, +85°C, and +125°C. 5 These times do not include thermal settling and internal filter response times, which may affect overall accuracy. 6 The sync input clock and internal sampling clock function below the specified minimum value, at reduced performance levels. Rev. D | Page 3 of 20 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAM TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS TIMING SPECIFICATIONS Timing Diagrams ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS THEORY OF OPERATION READING SENSOR DATA OUTPUT DATA REGISTERS Rotation Rate (Gyroscope) Internal Temperature DEVICE CONFIGURATION Dual Memory Structure USER REGISTERS DIGITAL PROCESSING CONFIGURATION INTERNAL SAMPLE RATE INPUT CLOCK CONFIGURATION DIGITAL FILTERING AVERAGING/DECIMATION FILTER CALIBRATION AUTOMATIC BIAS CORRECTION (AUTONULL) MANUAL BIAS CORRECTION Restoring Factory Calibration ALARMS STATIC ALARM USE DYNAMIC ALARM USE ALARM REPORTING Alarm Example SYSTEM CONTROLS GLOBAL COMMANDS Software Reset MEMORY MANAGEMENT Checksum Test GENERAL-PURPOSE INPUT/OUTPUT Data Ready Input/Output Indicator Example Input/Output Configuration AUTOMATIC SELF TEST POWER MANAGEMENT STATUS PRODUCT IDENTIFICATION APPLICATIONS INFORMATION POWER SUPPLY CONSIDERATIONS PROTOTYPE INTERFACE BOARD INSTALLATION TIPS PACKAGING AND ORDERING INFORMATION OUTLINE DIMENSIONS ORDERING GUIDE
Data Sheet ADIS16136 SPECIFICATIONS
TA = 25°C, VDD = 5.0 V, angular rate = 0°/sec, dynamic range = ±450°/sec, ±1 g, unless otherwise noted.
Table 1. Parameter Test Conditions/Comments Min Typ Max Unit
GYROSCOPES Dynamic Range ±450 ±480 °/sec Sensitivity GYRO_OUT, GYRO_OUT2 (24 bits) 7.139x10−5 °/sec/LSB Repeatability1 −40°C ≤ TA ≤ +70°C ±1 % Sensitivity Temperature Coefficient −40°C ≤ TA ≤ +70°C, 1 σ ±35 ppm/°C Nonlinearity Best fit straight line, ±400°/sec ±0.01 % of FS Bias Repeatability1, 2 −40°C ≤ TA ≤ +70°C, 1 σ ±0.15 °/sec Bias Temperature Coefficient −40°C ≤ TA ≤ +70°C, 1 σ ±0.00125 °/sec/°C In-Run Bias Stability 25°C, SMPL_PRD = 0x000F 4 °/hr Angular Random Walk 1 σ, 25°C 0.167 °/√hr Linear Acceleration Effect on Bias 1 σ 0.017 °/sec/g Bias Voltage Sensitivity VDD = 4.75 V to 5.25 V, 1 σ ±0.08 °/sec/V Misalignment Axis-to-frame (package) ±1.0 Degrees Output Noise No filtering 0.11 °/sec rms Rate Noise Density f = 25 Hz, no filtering 0.00357 °/sec/√Hz rms 3 dB Bandwidth 380 Hz Sensor Resonant Frequency 15.5 17.5 20 kHz LOGIC INPUTS3 Input High Voltage, VIH 2.0 V Input Low Voltage, VIL 0.8 V Logic 1 Input Current, IIH VIH = 3.3 V ±0.2 ±1 µA Logic 0 Input Current, IIL VIL = 0 V All Pins Except RST 40 60 μA RST Pin 80 μA Input Capacitance, CIN 10 pF DIGITAL OUTPUTS3 Output High Voltage, VOH ISOURCE = 1.6 mA 2.4 V Output Low Voltage, VOL ISINK = 1.6 mA 0.4 V FLASH MEMORY Endurance4 10,000 Cycles Data Retention4 TJ = 85°C 20 Years FUNCTIONAL TIMES5 Time until data is available Power-On Start-Up Time 245 ms Reset Recovery Time 128 ms Sleep Mode Recovery Time 2.5 ms Flash Memory Update 72 ms Flash Memory Self Test 21 ms Automatic Sensor Self Test Time SMPL_PRD ≠ 0x0000 245 ms SAMPLE RATE 6806 2048 SPS Internal Sample Rate Accuracy SMPL_PRD = 0x000F ±3 % Input Sync Clock Range SMPL_PRD = 0x0000 6806 2048 Hz POWER SUPPLY Operating voltage range, VDD 4.75 5.0 5.25 V Power Supply Current SMPL_PRD = 0x001F 120 mA Sleep mode 1.4 mA 1 The Repeatability specifications represent analytical projections, which are based off of the following drift contributions and conditions: temperature hysteresis (−40°C to +70°C), electronics drift (High-Temperature Operating Life test: +85°C, 500 hours), drift from temperature cycling (JESD22, Method A104-C, Method N, 500 cycles, −40°C to +85°C), rate random walk (10 year projection), and broadband noise 2 Bias repeatability describes a long-term behavior, over a variety of conditions. Short-term repeatability is related to the in-run bias stability and noise density specifications. 3 The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant. 4 JEDEC Standard 22, Method A117. Endurance measured at −40°C, +25°C, +85°C, and +125°C. 5 These times do not include thermal settling and internal filter response times, which may affect overall accuracy. 6 The sync input clock and internal sampling clock function below the specified minimum value, at reduced performance levels. Rev. D | Page 3 of 20 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAM TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS TIMING SPECIFICATIONS Timing Diagrams ABSOLUTE MAXIMUM RATINGS ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS THEORY OF OPERATION READING SENSOR DATA OUTPUT DATA REGISTERS Rotation Rate (Gyroscope) Internal Temperature DEVICE CONFIGURATION Dual Memory Structure USER REGISTERS DIGITAL PROCESSING CONFIGURATION INTERNAL SAMPLE RATE INPUT CLOCK CONFIGURATION DIGITAL FILTERING AVERAGING/DECIMATION FILTER CALIBRATION AUTOMATIC BIAS CORRECTION (AUTONULL) MANUAL BIAS CORRECTION Restoring Factory Calibration ALARMS STATIC ALARM USE DYNAMIC ALARM USE ALARM REPORTING Alarm Example SYSTEM CONTROLS GLOBAL COMMANDS Software Reset MEMORY MANAGEMENT Checksum Test GENERAL-PURPOSE INPUT/OUTPUT Data Ready Input/Output Indicator Example Input/Output Configuration AUTOMATIC SELF TEST POWER MANAGEMENT STATUS PRODUCT IDENTIFICATION APPLICATIONS INFORMATION POWER SUPPLY CONSIDERATIONS PROTOTYPE INTERFACE BOARD INSTALLATION TIPS PACKAGING AND ORDERING INFORMATION OUTLINE DIMENSIONS ORDERING GUIDE