Datasheet AD652 (Analog Devices) - 9

FabricanteAnalog Devices
DescripciónMonolithic Synchronous Voltage-to-Frequency Converter
Páginas / Página12 / 9 — STANDARD. 5962-93222. MICROCIRCUIT DRAWING
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STANDARD. 5962-93222. MICROCIRCUIT DRAWING

STANDARD 5962-93222 MICROCIRCUIT DRAWING

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TABLE IIA. Electrical test requirements. Test requirements Subgroups Subgroups (in accordance with (in accordance with MIL-STD-883, MIL-PRF-38535, table III) method 5005, table I) Device Device Device class M class Q class V Interim electrical 1 1 1 parameters (see 4.2) Final electrical 1,2,3,4,9 1/ 1,2,3,4,9 1/ 2/ 1,2,3, 1/ 2/ 3/ parameters (see 4.2) 4,5,6,9,10,11 Group A test 1,2,3,4,9 1,2,3,4,9 2/ 1,2,3, 2/ requirements (see 4.4) 4,5,6,9,10,11 Group C end-point electrical 1 1 1,2,3, 3/ parameters (see 4.4) 4,5,6,9,10,11 Group D end-point electrical 1 1 1,2,3,4,5,6, parameters (see 4.4) 9,10,11 Group E end-point electrical --- --- --- parameters (see 4.4) 1/ PDA applies to subgroup 1. 2/ See table I for specific subgroups 2, 3, 5, 6, 10, and 11 parameters applicable only to device class V. 3/ Delta limits as specified in table IIB shall be required where specified, and the delta limits shall be computed with reference to the zero hour electrical parameters (see table I). TABLE IIB. Burn-in and operating life test delta parameters. TA = +25C. 1/ 2/ Parameters Symbol Condition Delta limits Quiescent current ISS VS = 15 V, VIN = 0.1 V 1.7 mA Op amp input offset voltage VOS VIN = 0 V 0.5 mV f Gain error CLOCK = 4 MHz, AE 0.25% FSR VIN = 0.01 V, 9.4 V Clock input current IC CLOCK IN pin = 0 V 2.5 A Leakage current IL VOUT = 36 V 1 A 1/ Deltas are performed at room temperature. 2/ 240 hour burn-in and 1,000 hour operating group C life test.
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5962-93222 MICROCIRCUIT DRAWING A
DLA LAND AND MARITIME REVISION LEVEL SHEET COLUMBUS, OHIO 43218-3990 C 9 DSCC FORM 2234 APR 97