Datasheet ADXL345 (Analog Devices) - 6

TABLE I. Electrical performance characteristics - Continued. 1/ Test Symbol Test conditions Limits Unit 2/ Min Typ 3/ Max
Self-test
8/ Output change in X-axis 0.20 2.10 g Output change in Y-axis -2.10 -0.20 Output change in Z-axis 0.30 3.40
Power supply
Operating voltage range VS 2.0 2.5 3.6 V Interface voltage range VDD I/O 1.7 1.8 VS V Supply current ODR ≥ 100 Hz 140 µA ODR < 10 Hz 23 Standby mode leakage current 0.1 Turn-on and wake up time 9/ ODR = 3200 Hz 1.4 ms
Temperature
Operating temperature range -55 +105 °C
Weight
Device weight 30 mg 1/ Testing and other quality control techniques are used to the extent deemed necessary to assure product performance over the specified temperature range. Product may not necessarily be tested across the full temperature range and all parameters may not necessarily be tested. In the absence of specific parametric testing, product performance is assured by characterization and/or design. 2/ TA = 25°C, VS = 2.5 V, VDD I/O = 1.8 V, acceleration = 0 g, CS = 10 µF tantalum, CI/O = 0.1 µF, Output Data Rate (ODR) = 800 Hz, unless otherwise noted. All minimum and maximum specification are guaranteed. Typical specifications are not guaranteed. 3/ The typical specifications shown are for at least 68% of the population of parts and are based on the worst case of mean ±1 σ, except for 0 g output and sensitivity, which represents the target value. For 0 g output and sensitivity, the deviation from the ideal describes the worst case of mean ±1 σ. 4/ Cross axis sensitivity is defined as coupling between any two axes. 5/ Bandwidth is the -3 dB frequency and is defined as half the output data rate, bandwidth = ODR/2. 6/ The output format for the 3200 Hz and 1600 Hz ODR is different from the output format for the remaining ODRs. This difference is described in the manufacturer data sheet. 7/ Output data rates below 6.25 Hz exhibit additional offset shift with increased temperature, depending on selected output data rate. Refer manufacturer data sheet. 8/ Self-test change is defined as the output (g) when the SELF_TEST bit = 1 (in the DATA_FORMAT register, Address 0x31) minus the output (g) when the SELF_TEST bit = 0. Due to device filtering, the output reaches its final value after 4 x Ƭ when enabling or disabling self-test, where Ƭ = 1/(data rate). The part must be in normal power operation (LOW_POWER bit =0 in the BW_RATE register, Address 0x2C) for self-test to operate correctly. 9/ Turn on and wake up times are determined by the user defined bandwidth. At a 100 Hz data rate, the turn-on and wake-up times are each approximately 11.1 ms. For other data rates, the turn on and wake up times are each approximately Ƭ + 1.1 in milliseconds, where Ƭ = 1/(data rate).
DLA LAND AND MARITIME
SIZE CODE IDENT NO. DWG NO.
COLUMBUS, OHIO A 16236 V62/12657
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