Datasheet ADXL312 (Analog Devices) - 10 Fabricante Analog Devices Descripción 3-Axis, ±1.5 g/±3 g/±6 g/±12 g Digital Accelerometer Páginas / Página 33 / 10 — Data Sheet. ADXL312. U P. ER P. 0.2. 0.4. 0.6. 0.8. 1.0. 1.2. 1.4. 1.6. … Revisión B Formato / tamaño de archivo PDF / 536 Kb Idioma del documento Inglés
Data Sheet. ADXL312. U P. ER P. 0.2. 0.4. 0.6. 0.8. 1.0. 1.2. 1.4. 1.6. 1.8. 2.0. SELF-TEST RESPONSE (g. CURRENT (nA). PU O. N E. R PE. PER. 100. 120. 140. 160. 180. 200
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Línea de modelo para esta hoja de datos Versión de texto del documento Data Sheet ADXL312 80 80 70 70 ) ) % % ( 60 ( 60 N N IO IO T T A 50 A 50 L L U P PU 40 40 PO PO F F O O T 30 T 30 EN EN C C 20 R 20 ER P PE 10 10 0 50 180.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 -010 0 0 0 0 0 0 0 0 0 0 0 130 50 70 90 1- 7911 13 15 17 19 21 23 25 27 29 31 79SELF-TEST RESPONSE (g ) 08CURRENT (nA) 08 Figure 15. X-Axis Self-Test Delta, VS = VDD I/O = 3.3 V, 25°C Figure 18. Standby Mode Current Consumption, VS = VDD I/O = 3.3 V, 25°C70 35 60 30 ) ) % % ( ( N 50 N 25 IO IO T T A A L L 40 20 PU PU O PO P F 30 F 15 O O T T N E EN C 20 C 10 R PE PER 10 5 0 60 .1 .9 .7 .5 .3 .1 .9 .7 .5 .3 01 19 1- -0–2 –1 –1 –1 –1 –1 –0 –0 –0 –0 100 120 140 160 180 200 220 240 260 280 300 79 91 08CURRENT CONSUMPTION (µA) SELF-TEST RESPONSE (g ) 87 0 Figure 16. Y-Axis Self-Test Delta, VS = VDD I/O = 3.3 V, 25°C Figure 19. Current Consumption, Measurement Mode, Data Rate = 100 Hz, VS = VDD I/O = 3.3 V, 25°C80 200 70 ) % ( 60 150 N A) IO µ T ( A 50 L NT PU 40 100 PO F CURRE O Y T 30 L P EN C UP R S 20 50 PE 10 0 0 17 30.3 0.6 0.9 1.2 1.5 1.8 2.1 2.4 2.7 3.0 3.3 02.0 2.4 2.8 3.2 3.6 3 1- 2 1- 79SELF-TEST RESPONSE (g ) 79 08SUPPLY VOLTAGE (V) 08 Figure 17. Z-Axis Self-Test Delta, VS = VDD I/O = 3.3 V, 25°C Figure 20. Supply Current vs. Supply Voltage, VS at 25°C Rev. B | Page 9 of 32 Document Outline Features Applications General Description Functional Block Diagram Revision History Specifications Absolute Maximum Ratings Thermal Resistance ESD Caution Pin Configuration and Function Descriptions Typical Performance Characteristics Theory of Operation Power Sequencing Power Savings Power Modes Autosleep Mode Standby Mode Serial Communications Serial Port I/O Default states SPI Preventing Bus Traffic Errors I2C Interrupts DATA_READY Activity Inactivity Watermark Overrun FIFO Bypass Mode FIFO Mode Stream Mode Trigger Mode Retrieving Data from FIFO Self-Test Register Map Register Definitions Register 0x00—DEVID (Read Only) Register 0x1E, Register 0x1F, Register 0x20—OFSX, OFSY, OFSZ (Read/Write) Register 0x24—THRESH_ACT (Read/Write) Register 0x25—THRESH_INACT (Read/Write) Register 0x26—TIME_INACT (Read/Write) Register 0x27—ACT_INACT_CTL (Read/Write) ACT AC/DC and INACT AC/DC Bits ACT_x Enable Bits and INACT_x Enable Bits Register 0x2C—BW_RATE (Read/Write) LOW_POWER Bit Rate Bits Register 0x2D—POWER_CTL (Read/Write) Link Bit AUTO_SLEEP Bit Measure Bit Sleep Bit Wake-Up Bits Register 0x2E—INT_ENABLE (Read/Write) Register 0x2F—INT_MAP (Read/Write) Register 0x30—INT_SOURCE (Read Only) Register 0x31—DATA_FORMAT (Read/Write) SELF_TEST Bit SPI Bit INT_INVERT Bit FULL_RES Bit Justify Bit Range Bits Register 0x32 to Register 0x37—DATAX0, DATAX1, DATAY0, DATAY1, DATAZ0, DATAZ1 (Read Only) Register 0x38—FIFO_CTL (Read/Write) FIFO_MODE Bits Trigger Bit Samples Bits 0x39—FIFO_STATUS (Read Only) FIFO_TRIG Bit Entries Bits Applications Information Power Supply Decoupling Mechanical Considerations for Mounting Threshold Link Mode Sleep Mode vs. Low Power Mode Using Self-Test Data Formatting of Upper Data Rates Noise Performance Axes of Acceleration Sensitivity Solder Profile Outline Dimensions Ordering Guide Automotive Products