Datasheet MCP1501 (Microchip) - 7
| Fabricante | Microchip |
| Descripción | High-Precision Buffered Voltage Reference |
| Páginas / Página | 34 / 7 — MCP1501. 1.1.7 INPUT CURRENT The input current (operating current) is the … |
| Revisión | 08-25-2017 |
| Formato / tamaño de archivo | PDF / 863 Kb |
| Idioma del documento | Inglés |
MCP1501. 1.1.7 INPUT CURRENT The input current (operating current) is the current that
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Versión de texto del documento
MCP1501
1.1.7 INPUT CURRENT The input current (operating current) is the current that
sinks from VIN to GND without a load current on the
output pin. This current is affected by temperature,
input voltage, output voltage, and the load current. 1.1.8 POWER SUPPLY REJECTION
RATIO Power supply rejection ratio (PSRR) is a measure of
the change in output voltage (∆VOUT) relative to the
change in input voltage (∆VIN) over frequency. 1.1.9 LONG-TERM DRIFT The long-term output stability is measured by exposing
the devices to an ambient temperature of +125°C, as
shown in Figure 2-18 while configured in the circuit
shown in Figure 1-1. In this test, all electrical specifications of the devices are measured periodically at
+25°C. Power VIN
GND FB
VOUT Signal In FIGURE 1-1:
1.1.10 GND GND GND GND Long-Term Drift Test Circuit. OUTPUT VOLTAGE HYSTERESIS The output voltage hysteresis is a measure of the output voltage error after the powered devices are cycled
over the entire operating temperature range. The
amount of hysteresis can be quantified by measuring
the change in the +25°C output voltage after temperature excursions from +25°C to +125°C to +25°C, and
also from +25°C to –40°C to +25°C. 2015-2017 Microchip Technology Inc. DS20005474E-page 7
1.1.7 INPUT CURRENT The input current (operating current) is the current that
sinks from VIN to GND without a load current on the
output pin. This current is affected by temperature,
input voltage, output voltage, and the load current. 1.1.8 POWER SUPPLY REJECTION
RATIO Power supply rejection ratio (PSRR) is a measure of
the change in output voltage (∆VOUT) relative to the
change in input voltage (∆VIN) over frequency. 1.1.9 LONG-TERM DRIFT The long-term output stability is measured by exposing
the devices to an ambient temperature of +125°C, as
shown in Figure 2-18 while configured in the circuit
shown in Figure 1-1. In this test, all electrical specifications of the devices are measured periodically at
+25°C. Power VIN
GND FB
VOUT Signal In FIGURE 1-1:
1.1.10 GND GND GND GND Long-Term Drift Test Circuit. OUTPUT VOLTAGE HYSTERESIS The output voltage hysteresis is a measure of the output voltage error after the powered devices are cycled
over the entire operating temperature range. The
amount of hysteresis can be quantified by measuring
the change in the +25°C output voltage after temperature excursions from +25°C to +125°C to +25°C, and
also from +25°C to –40°C to +25°C. 2015-2017 Microchip Technology Inc. DS20005474E-page 7