Datasheet MCP6V81, MCP6V81U, MCP6V82, MCP6V84 (Microchip) - 6

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MCP6V81/1U/2/4 1.3 Timing Diagrams 1.4 Test Circuits
The circuits used for most DC and AC tests are shown in Figures 1-4 and 1-5. Lay the bypass capacitors out 2.2V to 5.5V V 2.2V 0V as discussed in
Section 4.3.10 “Supply Bypassing
DD
and Filtering”
. RN is equal to the parallel combination tSTR 1.001(V of R DD/3) F and RG to minimize bias current effects. VOUT 0.999(VDD/3) VDD 1 µF R
FIGURE 1-1:
Amplifier Start-Up. V N IN R + ISO VOUT
MCP6V8X
- VIN CL RL 100 nF V t DD/3 STL VOS + 100 µV V R L V G RF OS VOS – 100 µV
FIGURE 1-4:
AC and DC Test Circuit for Most Non-Inverting Gain Conditions.
FIGURE 1-2:
Offset Correction Settling Time. VDD 1 µF R V V N IN DD/3 R + ISO VOUT
MCP6V8X
t - ODR CL RL 100 nF V V IN DD V t L ODR RG RF VOUT V
FIGURE 1-5:
AC and DC Test Circuit for DD/2 Most Inverting Gain Conditions. VSS The circuit in Figure 1-6 tests the input’s dynamic
FIGURE 1-3:
Output Overdrive Recovery. behavior (i.e., IMD, tSTR, tSTL and tODR). The potentiometer balances the resistor network (VOUT should equal VREF at DC). The op amp’s common-mode input voltage is VCM = VIN/2. The error at the input (VERR) appears at VOUT with a noise gain of 10 V/V. 11.0 kΩ 100 kΩ 500Ω 0.1% 0.1% 25 turn VREF = VDD/3 VDD RISO 1 µF 0 Ω VOUT VIN 100 nF CL RL
MCP6V8X
30 pF open VL 11.0 kΩ 100 kΩ 249Ω 0.1% 0.1% 1%
FIGURE 1-6:
Test Circuit for Dynamic Input Behavior. DS20005419B-page 6  2016 Microchip Technology Inc. Document Outline 5 MHz, 0.5 mA, Zero-Drift Op Amps Features Typical Applications Design Aids Related Parts Description Package Types Typical Application Circuit FIGURE 1: Input Offset Voltage vs. Ambient Temperature with VDD = 2.2V. FIGURE 2: Input Offset Voltage vs. Ambient Temperature with VDD = 5.5V. 1.0 Electrical Characteristics 1.1 Absolute Maximum Ratings † 1.2 Specifications TABLE 1-1: DC Electrical Specifications TABLE 1-2: AC Electrical Specifications TABLE 1-3: Temperature Specifications 1.3 Timing Diagrams FIGURE 1-1: Amplifier Start-Up. FIGURE 1-2: Offset Correction Settling Time. FIGURE 1-3: Output Overdrive Recovery. 1.4 Test Circuits FIGURE 1-4: AC and DC Test Circuit for Most Non-Inverting Gain Conditions. FIGURE 1-5: AC and DC Test Circuit for Most Inverting Gain Conditions. FIGURE 1-6: Test Circuit for Dynamic Input Behavior. 2.0 Typical Performance Curves 2.1 DC Input Precision FIGURE 2-1: Input Offset Voltage. FIGURE 2-2: Input Offset Voltage Drift. FIGURE 2-3: Input Offset Voltage Quadratic Temperature Coefficient. FIGURE 2-4: Input Offset Voltage vs. Power Supply Voltage with VCM = VCML. FIGURE 2-5: Input Offset Voltage vs. Power Supply Voltage with VCM = VCMH. FIGURE 2-6: Input Offset Voltage vs. Output Voltage with VDD = 2.2V. FIGURE 2-7: Input Offset Voltage vs. Output Voltage with VDD = 5.5V. FIGURE 2-8: Input Offset Voltage vs. Common-Mode Voltage with VDD = 2.2V. FIGURE 2-9: Input Offset Voltage vs. Common-Mode Voltage with VDD = 5.5V. FIGURE 2-10: Common-Mode Rejection Ratio. FIGURE 2-11: Power Supply Rejection Ratio. FIGURE 2-12: DC Open-Loop Gain. FIGURE 2-13: CMRR and PSRR vs. Ambient Temperature. FIGURE 2-14: DC Open-Loop Gain vs. Ambient Temperature. FIGURE 2-15: Input Bias and Offset Currents vs. Common-Mode Input Voltage with TA = +85°C. FIGURE 2-16: Input Bias and Offset Currents vs. Common-Mode Input Voltage with TA = +125°C. FIGURE 2-17: Input Bias and Offset Currents vs. Ambient Temperature with VDD = 5.5V. FIGURE 2-18: Input Bias Current vs. Input Voltage (Below VSS). 2.2 Other DC Voltages and Currents FIGURE 2-19: Input Common-Mode Voltage Headroom (Range) vs. Ambient Temperature. FIGURE 2-20: Output Voltage Headroom vs. Output Current. FIGURE 2-21: Output Voltage Headroom vs. Ambient Temperature. FIGURE 2-22: Output Short-Circuit Current vs. Power Supply Voltage. FIGURE 2-23: Supply Current vs. Power Supply Voltage. FIGURE 2-24: Power-on Reset Trip Voltage. FIGURE 2-25: Power-on Reset Voltage vs. Ambient Temperature. 2.3 Frequency Response FIGURE 2-26: CMRR and PSRR vs. Frequency. FIGURE 2-27: Open-Loop Gain vs. Frequency with VDD = 2.2V. FIGURE 2-28: Open-Loop Gain vs. Frequency with VDD = 5.5V. FIGURE 2-29: Gain Bandwidth Product and Phase Margin vs. Ambient Temperature. FIGURE 2-30: Gain Bandwidth Product and Phase Margin vs. Common-Mode Input Voltage. FIGURE 2-31: Gain Bandwidth Product and Phase Margin vs. Output Voltage. FIGURE 2-32: Closed-Loop Output Impedance vs. Frequency with VDD = 2.2V. FIGURE 2-33: Closed-Loop Output Impedance vs. Frequency with VDD = 5.5V. FIGURE 2-34: Maximum Output Voltage Swing vs. Frequency. FIGURE 2-35: EMIRR vs. Frequency. FIGURE 2-36: EMIRR vs. Input Voltage. FIGURE 2-37: Channel-to-Channel Separation vs. Frequency. 2.4 Input Noise and Distortion FIGURE 2-38: Input Noise Voltage Density and Integrated Input Noise Voltage vs. Frequency. FIGURE 2-39: Input Noise Voltage Density vs. Input Common-Mode Voltage. FIGURE 2-40: Intermodulation Distortion vs. Frequency with VCM Disturbance (see Figure 1-6). FIGURE 2-41: Intermodulation Distortion vs. Frequency with VDD Disturbance (see Figure 1-6). FIGURE 2-42: Input Noise vs. Time with 1 Hz and 10 Hz Filters and VDD = 2.2V. FIGURE 2-43: Input Noise vs. Time with 1 Hz and 10 Hz Filters and VDD = 5.5V. 2.5 Time Response FIGURE 2-44: Input Offset Voltage vs. Time with Temperature Change. FIGURE 2-45: Input Offset Voltage vs. Time at Power-Up. FIGURE 2-46: The MCP6V81/1U/2/4 Family Shows No Input Phase Reversal with Overdrive. FIGURE 2-47: Non-Inverting Small Signal Step Response. FIGURE 2-48: Non-Inverting Large Signal Step Response. FIGURE 2-49: Inverting Small Signal Step Response. FIGURE 2-50: Inverting Large Signal Step Response. FIGURE 2-51: Slew Rate vs. Ambient Temperature. FIGURE 2-52: Output Overdrive Recovery vs. Time with G = -10 V/V. FIGURE 2-53: Output Overdrive Recovery Time vs. Inverting Gain. 3.0 Pin Descriptions TABLE 3-1: Pin Function Table 3.1 Analog Outputs (VOUT, VOUTA, VOUTB, VOUTC, VOUTD) 3.2 Analog Inputs (VIN-, VIN+, VINB+, VINB-, VINC-, VINC+, VIND+, VIND-) 3.3 Power Supply Pins (VDD, VSS) 3.4 Exposed Thermal Pad (EP) 4.0 Applications 4.1 Overview of Zero-Drift Operation FIGURE 4-1: Simplified Zero-Drift Op Amp Functional Diagram. FIGURE 4-2: First Chopping Clock Phase; Equivalent Amplifier Diagram. FIGURE 4-3: Second Chopping Clock Phase; Equivalent Amplifier Diagram. 4.2 Other Functional Blocks FIGURE 4-4: Simplified Analog Input ESD Structures. FIGURE 4-5: Protecting the Analog Inputs Against High Voltages. FIGURE 4-6: Protecting the Analog Inputs Against High Currents. 4.3 Application Tips FIGURE 4-7: Output Resistor, RISO, Stabilizes Capacitive Loads. FIGURE 4-8: Recommended RISO values for Capacitive Loads. FIGURE 4-9: Output Load. FIGURE 4-10: Amplifier with Parasitic Capacitance. 4.4 Typical Applications FIGURE 4-11: Simple Design. FIGURE 4-12: RTD Sensor. FIGURE 4-13: Offset Correction. FIGURE 4-14: Precision Comparator. 5.0 Design Aids 5.1 FilterLab® Software 5.2 Microchip Advanced Part Selector (MAPS) 5.3 Analog Demonstration and Evaluation Boards 5.4 Application Notes 6.0 Packaging Information 6.1 Package Marking Information Appendix A: Revision History Product Identification System Trademarks Worldwide Sales and Service