Datasheet LTC2986, LTC2986-1 (Analog Devices) - 6

LTC2986/LTC2986-1
LTC2986-1 EEPROM CHARACTERISTICS The
l
denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25°C. These specifications apply only to LTC2986-1, LTC2986 does not include EEPROM. SYMBOL PARAMETER CONDITIONS MIN TYP MAX UNITS
Retention Notes 4 and 17 l 10 Years Endurance Note 4 l 10000 Cycles Programming Time Complete Transfer from RAM to EEPROM l 2600 ms Read Time Complete Transfer EEPROM to RAM l 20 ms
Note 1:
Stresses beyond those listed under Absolute Maximum Ratings
Note 14:
Hysteresis in output voltage is created by package stress may cause permanent damage to the device. Exposure to any Absolute that differs depending on whether the IC was previously at a higher or Maximum Rating condition for extended periods may affect device lower temperature. Output voltage is always measured at 25°C, but reliability and lifetime. the IC is cycled to the hot or cold temperature limit before successive
Note 2:
All voltage values are with respect to GND. measurements. Hysteresis measures the maximum output change for the
Note 3:
Full scale ADC error. Measurements do not include reference error. averages of three hot or cold temperature cycles. For instruments that are stored at well controlled temperatures (within 20 or 30 degrees of
Note 4:
Guaranteed by design, not subject to test. operational temperature), it is usually not a dominant error source. Typical
Note 5:
The input referred noise includes the contribution of internal hysteresis is the worst-case of 25°C to cold to 25°C or 25°C to hot to calibration operations. 25°C, preconditioned by one thermal cycle.
Note 6:
MUX configuration delay = default 1ms.
Note 15:
Differential Input Range is ±VREF/2.
Note 7:
Global configuration set to 60Hz rejection.
Note 16:
RTD and thermistor measurements are made ratiometrically.
Note 8:
Global configuration set to 50Hz rejection. As a result, current source excitation variation does not affect absolute
Note 9:
Global configuration default 50Hz/60Hz rejection. accuracy. Choose an excitation current such that largest sensor or RSENSE
Note 10:
The exact value of V resistance value, when driven by the nominal excitation current, will drop REF is stored in the LTC2986 and used for all measurement calculations. Temperature coefficient is measured 1V or less. The extended ADC input range will accommodate variation in by dividing the maximum change in output voltage by the specified excitation current and the ratiometric calculation will negate the absolute temperature range. value of the excitation current.
Note 11:
Analog power-up. Command status register inaccessible during
Note 17:
10-year data retention guaranteed for up to 1000 program cycles. this time.
Note 18:
Do not apply voltage or current sources to these pins. They must
Note 12:
Digital initialization. Begins at the conclusion of Analog be connected to capacitive loads only. Otherwise, permanent damage may Power-Up. Command status register is 0×80 at the beginning of digital occur. initialization and 0×40 at the conclusion.
Note 19:
Input leakage measured with VIN = –10mV and VIN = 2.5V.
Note 13:
Long-term stability typically has a logarithmic characteristic and therefore, changes after 1000 hours tend to be much smaller than before that time. Total drift in the second thousand hours is normally less than one third that of the first thousand hours with a continuing trend toward reduced drift with time. Long-term stability will also be affected by differential stresses between the IC and the board material created during board assembly. 29861fa 6 For more information www.linear.com/LTC2986 Document Outline Features Applications Typical Application Description Absolute Maximum Ratings Order Information Pin Configuration Complete System Electrical Characteristics ADC Electrical Characteristics Reference Electrical Characteristics Digital Inputs and Digital Outputs LTC2986-1 EEPROM Characteristics Typical Performance Characteristics Pin Functions Block Diagram Test Circuits Timing Diagram Overview Applications Information EEPROM Overview (LTC2986-1) EEPROM Read/Write Validation EEPROM Write Operation EEPROM Read Operation (LTC2986-1) Thermocouple Measurements Diode Measurements RTD Measurements Thermistor Measurements Global Configuration Register Input Overvoltage Protection – Overview Active Analog Temperature Sensors Direct ADC Measurements 2- and 3-Cycle Conversion Modes Running Conversions Consecutively on Multiple Channels Entering/Exiting Sleep Mode MUX Configuration Delay Reference Considerations Custom Thermocouples Custom RTDs Custom Thermistors Package Description Revision History Typical Application Related Parts