Datasheet AD9635 (Analog Devices) - 7

FabricanteAnalog Devices
DescripciónDual, 12-Bit, 80 MSPS/125 MSPS Serial LVDS 1.8 V Analog-to-Digital Converter
Páginas / Página37 / 7 — AD9635. Data Sheet. SWITCHING SPECIFICATIONS. Table 4. Parameter1, 2. …
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AD9635. Data Sheet. SWITCHING SPECIFICATIONS. Table 4. Parameter1, 2. Temp. Min. Typ. Max. Unit. TIMING SPECIFICATIONS Table 5. Parameter

AD9635 Data Sheet SWITCHING SPECIFICATIONS Table 4 Parameter1, 2 Temp Min Typ Max Unit TIMING SPECIFICATIONS Table 5 Parameter

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AD9635 Data Sheet SWITCHING SPECIFICATIONS
AVDD = 1.8 V, DRVDD = 1.8 V, 2 V p-p differential input, 1.0 V internal reference, AIN = −1.0 dBFS, unless otherwise noted.
Table 4. Parameter1, 2 Temp Min Typ Max Unit
CLOCK3 Input Clock Rate Full 10 1000 MHz Conversion Rate4 Full 10 80/125 MSPS Clock Pulse Width High (tEH) Full 6.25/4.00 ns Clock Pulse Width Low (tEL) Full 6.25/4.00 ns OUTPUT PARAMETERS3 Propagation Delay (tPD) Full 1.5 2.3 3.1 ns Rise Time (tR) (20% to 80%) Full 300 ps Fall Time (tF) (20% to 80%) Full 300 ps FCO Propagation Delay (tFCO) Full 1.5 2.3 3.1 ns DCO Propagation Delay (tCPD)5 Full tFCO + (tSAMPLE/12) ns DCO to Data Delay (tDATA)5 Full (tSAMPLE/12) − 300 tSAMPLE/12 (tSAMPLE/12) + 300 ps DCO to FCO Delay (tFRAME)5 Full (tSAMPLE/12) − 300 tSAMPLE/12 (tSAMPLE/12) + 300 ps Lane Delay (tLD) 90 ps Data-to-Data Skew (tDATA-MAX − tDATA-MIN) Full ±50 ±200 ps Wake-Up Time (Standby) 25°C 250 ns Wake-Up Time (Power-Down)6 25°C 375 μs Pipeline Latency Full 16 Clock cycles APERTURE Aperture Delay (tA) 25°C 1 ns Aperture Uncertainty (Jitter, tJ) 25°C 174 fs rms Out-of-Range Recovery Time 25°C 1 Clock cycles 1 See the AN-835 Application Note, Understanding High Speed ADC Testing and Evaluation, for definitions and for details on how these tests were completed. 2 Measured on standard FR-4 material. 3 Can be adjusted via the SPI. The conversion rate is the clock rate after the divider. 4 The maximum conversion rate is based on two-lane output mode. See the Digital Outputs and Timing section for the maximum conversion rate in one-lane output mode. 5 tSAMPLE/12 is based on the number of bits in two LVDS data lanes. tSAMPLE = 1/fS. 6 Wake-up time is defined as the time required to return to normal operation from power-down mode.
TIMING SPECIFICATIONS Table 5. Parameter Description Limit Unit
SPI TIMING REQUIREMENTS See Figure 68 tDS Setup time between the data and the rising edge of SCLK 2 ns min tDH Hold time between the data and the rising edge of SCLK 2 ns min tCLK Period of the SCLK 40 ns min tS Setup time between CSB and SCLK 2 ns min tH Hold time between CSB and SCLK 2 ns min tHIGH SCLK pulse width high 10 ns min tLOW SCLK pulse width low 10 ns min tEN_SDIO Time required for the SDIO pin to switch from an input to an output relative 10 ns min to the SCLK falling edge (not shown in Figure 68) tDIS_SDIO Time required for the SDIO pin to switch from an output to an input relative 10 ns min to the SCLK rising edge (not shown in Figure 68) Rev. B | Page 6 of 36 Document Outline FEATURES APPLICATIONS GENERAL DESCRIPTION FUNCTIONAL BLOCK DIAGRAM PRODUCT HIGHLIGHTS TABLE OF CONTENTS REVISION HISTORY SPECIFICATIONS DC SPECIFICATIONS AC SPECIFICATIONS DIGITAL SPECIFICATIONS SWITCHING SPECIFICATIONS TIMING SPECIFICATIONS Timing Diagrams ABSOLUTE MAXIMUM RATINGS THERMAL RESISTANCE ESD CAUTION PIN CONFIGURATION AND FUNCTION DESCRIPTIONS TYPICAL PERFORMANCE CHARACTERISTICS AD9635-80 AD9635-125 EQUIVALENT CIRCUITS THEORY OF OPERATION ANALOG INPUT CONSIDERATIONS Input Common Mode Differential Input Configurations VOLTAGE REFERENCE CLOCK INPUT CONSIDERATIONS Clock Input Options Input Clock Divider Clock Duty Cycle Jitter Considerations POWER DISSIPATION AND POWER-DOWN MODE DIGITAL OUTPUTS AND TIMING SDIO/PDWN Pin SCLK/DFS Pin CSB Pin RBIAS Pin OUTPUT TEST MODES SERIAL PORT INTERFACE (SPI) CONFIGURATION USING THE SPI HARDWARE INTERFACE CONFIGURATION WITHOUT THE SPI SPI ACCESSIBLE FEATURES MEMORY MAP READING THE MEMORY MAP REGISTER TABLE Open Locations Default Values Logic Levels Channel-Specific Registers MEMORY MAP REGISTER TABLE MEMORY MAP REGISTER DESCRIPTIONS Device Index (Register 0x05) Transfer (Register 0xFF) Power Modes (Register 0x08) Bits[7:2]—Open Bits[1:0]—Power Mode Enhancement Control (Register 0x0C) Bits[7:3]—Open Bit 2—Chop Mode Bits[1:0]—Open Output Mode (Register 0x14) Bit 7—Open Bit 6—LVDS-ANSI/LVDS-IEEE Option Bits[5:3]—Open Bit 2—Output Invert Bit 1—Open Bit 0—Output Format Output Adjust (Register 0x15) Bits[7:6]—Open Bits[5:4]—Output Driver Termination Bits[3:1]—Open Bit 0—Output Drive Output Phase (Register 0x16) Bit 7—Open Bits[6:4]—Input Clock Phase Adjust Bits[3:0]—Output Clock Phase Adjust Serial Output Data Control (Register 0x21) Resolution/Sample Rate Override (Register 0x100) User I/O Control 2 (Register 0x101) Bits[7:1]—Open Bit 0—SDIO Pull-Down User I/O Control 3 (Register 0x102) Bits[7:4]—Open Bit 3—VCM Power-Down Bits[2:0]—Open APPLICATIONS INFORMATION DESIGN GUIDELINES POWER AND GROUND GUIDELINES CLOCK STABILITY CONSIDERATIONS EXPOSED PAD THERMAL HEAT SLUG RECOMMENDATIONS VCM REFERENCE DECOUPLING SPI PORT OUTLINE DIMENSIONS ORDERING GUIDE