Datasheet Texas Instruments SN74LVTH18504A — Ficha de datos

FabricanteTexas Instruments
SerieSN74LVTH18504A
Datasheet Texas Instruments SN74LVTH18504A

Dispositivos de prueba de escaneo ABT de 3.3 V con transceptores de bus universal de 20 bits

Hojas de datos

3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers datasheet
PDF, 923 Kb, Revisión: B, Archivo publicado: jun 1, 1997
Extracto del documento

Precios

Estado

SN74LVTH18504APMSN74LVTH18504APMG4SN74LVTH18504APMR
Estado del ciclo de vidaActivo (Recomendado para nuevos diseños)Activo (Recomendado para nuevos diseños)Activo (Recomendado para nuevos diseños)
Disponibilidad de muestra del fabricanteNoNoNo

Embalaje

SN74LVTH18504APMSN74LVTH18504APMG4SN74LVTH18504APMR
N123
Pin646464
Package TypePMPMPM
Industry STD TermLQFPLQFPLQFP
JEDEC CodeS-PQFP-GS-PQFP-GS-PQFP-G
Package QTY1601601000
CarrierJEDEC TRAY (10+1)JEDEC TRAY (10+1)LARGE T&R
Device MarkingLVTH18504ALVTH18504ALVTH18504A
Width (mm)101010
Length (mm)101010
Thickness (mm)1.41.41.4
Pitch (mm).5.5.5
Max Height (mm)1.61.61.6
Mechanical DataDescargarDescargarDescargar

Paramétricos

Parameters / ModelsSN74LVTH18504APM
SN74LVTH18504APM
SN74LVTH18504APMG4
SN74LVTH18504APMG4
SN74LVTH18504APMR
SN74LVTH18504APMR
Bits202020
F @ Nom Voltage(Max), Mhz160160160
ICC @ Nom Voltage(Max), mA272727
Operating Temperature Range, C-40 to 85-40 to 85-40 to 85
Output Drive (IOL/IOH)(Max), mA64/-3264/-3264/-32
Package GroupLQFPLQFPLQFP
Package Size: mm2:W x L, PKG64LQFP: 144 mm2: 12 x 12(LQFP)64LQFP: 144 mm2: 12 x 12(LQFP)64LQFP: 144 mm2: 12 x 12(LQFP)
RatingCatalogCatalogCatalog
Technology FamilyLVTLVTLVT
VCC(Max), V3.63.63.6
VCC(Min), V2.72.72.7
Voltage(Nom), V3.33.33.3
tpd @ Nom Voltage(Max), ns5.15.15.1

Plan ecológico

SN74LVTH18504APMSN74LVTH18504APMG4SN74LVTH18504APMR
RoHSObedienteObedienteObediente

Notas de aplicación

  • Programming CPLDs Via the 'LVT8986 LASP
    PDF, 819 Kb, Archivo publicado: nov 1, 2005
    This application report summarizes key information required for understanding the 'LVT8986 linking addressable scan ports (LASPs) multidrop addressable IEEE Std 1149.1 (JTAG) test access port (TAP) transceiver. This report includes information about the 'LVT8986 secondary TAPs, bypass and linking shadow protocol, scan-path description languages, serial vector format files, and an example of how to
  • LVT Family Characteristics (Rev. A)
    PDF, 98 Kb, Revisión: A, Archivo publicado: marzo 1, 1998
    To address the need for a complete low-voltage interface solution, Texas Instruments has developed a new generation of logic devices capable of mixed-mode operation. The LVT series relies on a state-of-the-art submicron BiCMOS process to provide up to a 90% reduction in static power dissipation over ABT. LVT devices solve the system need for a transparent seam between the low-voltage and 5-V secti
  • LVT-to-LVTH Conversion
    PDF, 84 Kb, Archivo publicado: dic 8, 1998
    Original LVT devices that have bus hold have been redesigned to add the High-Impedance State During Power Up and Power Down feature. Additional devices with and without bus hold have been added to the LVT product line. Design guidelines and issues related to the bus-hold features, switching characteristics, and timing requirements are discussed.
  • Bus-Hold Circuit
    PDF, 418 Kb, Archivo publicado: feb 5, 2001
    When designing systems that include CMOS devices, designers must pay special attention to the operating condition in which all of the bus drivers are in an inactive, high-impedance condition (3-state). Unless special measures are taken, this condition can lead to undefined levels and, thus, to a significant increase in the device?s power dissipation. In extreme cases, this leads to oscillation of

Linea modelo

Clasificación del fabricante

  • Semiconductors> Logic> Specialty Logic> Boundary Scan (JTAG) Logic