Datasheet Texas Instruments SN74LVTH182652A — Ficha de datos

FabricanteTexas Instruments
SerieSN74LVTH182652A
Datasheet Texas Instruments SN74LVTH182652A

Dispositivos de prueba de escaneo ABT de 3.3 V con transceptores y registros de 18 bits

Hojas de datos

3.3-V ABT Scan Test Devices With 18-Bit Transceivers And Registers datasheet
PDF, 610 Kb, Revisión: C, Archivo publicado: jun 1, 1997
Extracto del documento

Precios

Estado

SN74LVTH182652APM
Estado del ciclo de vidaActivo (Recomendado para nuevos diseños)
Disponibilidad de muestra del fabricanteNo

Embalaje

SN74LVTH182652APM
N1
Pin64
Package TypePM
Industry STD TermLQFP
JEDEC CodeS-PQFP-G
Package QTY160
CarrierJEDEC TRAY (10+1)
Device MarkingLVTH182652A
Width (mm)10
Length (mm)10
Thickness (mm)1.4
Pitch (mm).5
Max Height (mm)1.6
Mechanical DataDescargar

Paramétricos

Parameters / ModelsSN74LVTH182652APM
SN74LVTH182652APM
Bits18
F @ Nom Voltage(Max), Mhz160
ICC @ Nom Voltage(Max), mA24
Operating Temperature Range, C-40 to 85
Output Drive (IOL/IOH)(Max), mA64/-32
Package GroupLQFP
Package Size: mm2:W x L, PKG64LQFP: 144 mm2: 12 x 12(LQFP)
RatingCatalog
Technology FamilyLVT
VCC(Max), V3.6
VCC(Min), V2.7
Voltage(Nom), V3.3
tpd @ Nom Voltage(Max), ns4.7

Plan ecológico

SN74LVTH182652APM
RoHSObediente

Notas de aplicación

  • Programming CPLDs Via the 'LVT8986 LASP
    PDF, 819 Kb, Archivo publicado: nov 1, 2005
    This application report summarizes key information required for understanding the 'LVT8986 linking addressable scan ports (LASPs) multidrop addressable IEEE Std 1149.1 (JTAG) test access port (TAP) transceiver. This report includes information about the 'LVT8986 secondary TAPs, bypass and linking shadow protocol, scan-path description languages, serial vector format files, and an example of how to
  • LVT Family Characteristics (Rev. A)
    PDF, 98 Kb, Revisión: A, Archivo publicado: marzo 1, 1998
    To address the need for a complete low-voltage interface solution, Texas Instruments has developed a new generation of logic devices capable of mixed-mode operation. The LVT series relies on a state-of-the-art submicron BiCMOS process to provide up to a 90% reduction in static power dissipation over ABT. LVT devices solve the system need for a transparent seam between the low-voltage and 5-V secti
  • LVT-to-LVTH Conversion
    PDF, 84 Kb, Archivo publicado: dic 8, 1998
    Original LVT devices that have bus hold have been redesigned to add the High-Impedance State During Power Up and Power Down feature. Additional devices with and without bus hold have been added to the LVT product line. Design guidelines and issues related to the bus-hold features, switching characteristics, and timing requirements are discussed.
  • Bus-Hold Circuit
    PDF, 418 Kb, Archivo publicado: feb 5, 2001
    When designing systems that include CMOS devices, designers must pay special attention to the operating condition in which all of the bus drivers are in an inactive, high-impedance condition (3-state). Unless special measures are taken, this condition can lead to undefined levels and, thus, to a significant increase in the device?s power dissipation. In extreme cases, this leads to oscillation of

Linea modelo

Serie: SN74LVTH182652A (1)

Clasificación del fabricante

  • Semiconductors> Logic> Specialty Logic> Boundary Scan (JTAG) Logic