Datasheet Texas Instruments SN74BCT8374A — Ficha de datos

FabricanteTexas Instruments
SerieSN74BCT8374A
Datasheet Texas Instruments SN74BCT8374A

Dispositivo de prueba de escaneo con flip-flops de borde D de tipo D octal

Hojas de datos

Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops datasheet
PDF, 435 Kb, Revisión: E, Archivo publicado: jul 1, 1996
Extracto del documento

Precios

Estado

SN74BCT8374ADW
Estado del ciclo de vidaActivo (Recomendado para nuevos diseños)
Disponibilidad de muestra del fabricanteNo

Embalaje

SN74BCT8374ADW
N1
Pin24
Package TypeDW
Industry STD TermSOIC
JEDEC CodeR-PDSO-G
Package QTY25
CarrierTUBE
Device MarkingBCT8374A
Width (mm)7.5
Length (mm)15.4
Thickness (mm)2.35
Pitch (mm)1.27
Max Height (mm)2.65
Mechanical DataDescargar

Paramétricos

Parameters / ModelsSN74BCT8374ADW
SN74BCT8374ADW
Bits8
F @ Nom Voltage(Max), Mhz70
ICC @ Nom Voltage(Max), mA52
Operating Temperature Range, C0 to 70
Output Drive (IOL/IOH)(Max), mA64/-15
Package GroupSOIC
Package Size: mm2:W x L, PKG24SOIC: 160 mm2: 10.3 x 15.5(SOIC)
RatingCatalog
Technology FamilyBCT
VCC(Max), V5.5
VCC(Min), V4.5
Voltage(Nom), V5
tpd @ Nom Voltage(Max), ns10

Plan ecológico

SN74BCT8374ADW
RoHSObediente

Notas de aplicación

  • Programming CPLDs Via the 'LVT8986 LASP
    PDF, 819 Kb, Archivo publicado: nov 1, 2005
    This application report summarizes key information required for understanding the 'LVT8986 linking addressable scan ports (LASPs) multidrop addressable IEEE Std 1149.1 (JTAG) test access port (TAP) transceiver. This report includes information about the 'LVT8986 secondary TAPs, bypass and linking shadow protocol, scan-path description languages, serial vector format files, and an example of how to

Linea modelo

Serie: SN74BCT8374A (1)

Clasificación del fabricante

  • Semiconductors> Logic> Specialty Logic> Boundary Scan (JTAG) Logic