Datasheet Texas Instruments SN74BCT8244A — Ficha de datos
| Fabricante | Texas Instruments |
| Serie | SN74BCT8244A |
Dispositivo de prueba de escaneo de límites IEEE Std 1149.1 (JTAG) con búferes octales
Hojas de datos
Scan Test Devices With Octal Buffers datasheet
PDF, 385 Kb, Revisión: E, Archivo publicado: jul 1, 1996
Extracto del documento
Precios
Estado
| SN74BCT8244ADW | SN74BCT8244ADWE4 | |
|---|---|---|
| Estado del ciclo de vida | Activo (Recomendado para nuevos diseños) | Activo (Recomendado para nuevos diseños) |
| Disponibilidad de muestra del fabricante | No | Sí |
Embalaje
| SN74BCT8244ADW | SN74BCT8244ADWE4 | |
|---|---|---|
| N | 1 | 2 |
| Pin | 24 | 24 |
| Package Type | DW | DW |
| Industry STD Term | SOIC | SOIC |
| JEDEC Code | R-PDSO-G | R-PDSO-G |
| Package QTY | 25 | 25 |
| Carrier | TUBE | TUBE |
| Device Marking | BCT8244A | BCT8244A |
| Width (mm) | 7.5 | 7.5 |
| Length (mm) | 15.4 | 15.4 |
| Thickness (mm) | 2.35 | 2.35 |
| Pitch (mm) | 1.27 | 1.27 |
| Max Height (mm) | 2.65 | 2.65 |
| Mechanical Data | Descargar | Descargar |
Paramétricos
| Parameters / Models | SN74BCT8244ADW | SN74BCT8244ADWE4 |
|---|---|---|
| Bits | 8 | 8 |
| F @ Nom Voltage(Max), Mhz | 70 | 70 |
| ICC @ Nom Voltage(Max), mA | 52 | 52 |
| Operating Temperature Range, C | 0 to 70 | 0 to 70 |
| Output Drive (IOL/IOH)(Max), mA | 64/-15 | 64/-15 |
| Package Group | SOIC | SOIC |
| Package Size: mm2:W x L, PKG | 24SOIC: 160 mm2: 10.3 x 15.5(SOIC) | 24SOIC: 160 mm2: 10.3 x 15.5(SOIC) |
| Rating | Catalog | Catalog |
| Technology Family | BCT | BCT |
| VCC(Max), V | 5.5 | 5.5 |
| VCC(Min), V | 4.5 | 4.5 |
| Voltage(Nom), V | 5 | 5 |
| tpd @ Nom Voltage(Max), ns | 8.5 | 8.5 |
Plan ecológico
| SN74BCT8244ADW | SN74BCT8244ADWE4 | |
|---|---|---|
| RoHS | Obediente | Obediente |
Notas de aplicación
- Programming CPLDs Via the 'LVT8986 LASPPDF, 819 Kb, Archivo publicado: nov 1, 2005
This application report summarizes key information required for understanding the 'LVT8986 linking addressable scan ports (LASPs) multidrop addressable IEEE Std 1149.1 (JTAG) test access port (TAP) transceiver. This report includes information about the 'LVT8986 secondary TAPs, bypass and linking shadow protocol, scan-path description languages, serial vector format files, and an example of how to
Linea modelo
Serie: SN74BCT8244A (2)
Clasificación del fabricante
- Semiconductors> Logic> Specialty Logic> Boundary Scan (JTAG) Logic