Datasheet Texas Instruments SN54LVT18502 — Ficha de datos

FabricanteTexas Instruments
SerieSN54LVT18502

Dispositivos de prueba de escaneo ABT de 3.3V con transceptores de bus universal de 18 bits

Hojas de datos

3.3-V ABT Scan Test Devices With 18-Bit Universal Bus Transceivers
PDF, 498 Kb, Archivo publicado: jul 1, 1996

Precios

Estado

SNJ54LVT18502HV
Estado del ciclo de vidaObsoleto (El fabricante ha interrumpido la producción del dispositivo)
Disponibilidad de muestra del fabricanteNo

Embalaje

SNJ54LVT18502HV
N1
Pin68
Package TypeHV
Industry STD TermCFP
JEDEC CodeS-GQFP-F
Width (mm)12.51
Length (mm)12.51
Thickness (mm)3.56
Pitch (mm).635
Max Height (mm)3.86
Mechanical DataDescargar

Plan ecológico

SNJ54LVT18502HV
RoHSDesobediente
Pb gratisNo

Notas de aplicación

  • LVT Family Characteristics (Rev. A)
    PDF, 98 Kb, Revisión: A, Archivo publicado: marzo 1, 1998
    To address the need for a complete low-voltage interface solution, Texas Instruments has developed a new generation of logic devices capable of mixed-mode operation. The LVT series relies on a state-of-the-art submicron BiCMOS process to provide up to a 90% reduction in static power dissipation over ABT. LVT devices solve the system need for a transparent seam between the low-voltage and 5-V secti
  • LVT-to-LVTH Conversion
    PDF, 84 Kb, Archivo publicado: dic 8, 1998
    Original LVT devices that have bus hold have been redesigned to add the High-Impedance State During Power Up and Power Down feature. Additional devices with and without bus hold have been added to the LVT product line. Design guidelines and issues related to the bus-hold features, switching characteristics, and timing requirements are discussed.

Linea modelo

Serie: SN54LVT18502 (1)

Clasificación del fabricante

  • Semiconductors> Space & High Reliability> Logic Products> Specialty Logic Products> Boundary Scan (JTAG)