Datasheet Texas Instruments ADS5482 — Ficha de datos

Fabricante	Texas Instruments
Serie	ADS5482

Hojas de datos

Precios

Estado

Embalaje

Paramétricos

Parameters / Models	ADS5482IRGCR	ADS5482IRGCT
# Input Channels	1	1
Analog Input BW, MHz	125	125
Architecture	Pipeline	Pipeline
DNL(Max), +/-LSB	1	1
DNL(Typ), +/-LSB	0.5	0.5
ENOB, Bits	12.88	12.88
INL(Max), +/-LSB	10	10
INL(Typ), +/-LSB	3	3
Input Buffer	Yes	Yes
Input Range, Vp-p	3	3
Interface	Parallel LVDS	Parallel LVDS
Operating Temperature Range, C	-40 to 85	-40 to 85
Package Group	VQFN	VQFN
Package Size: mm2:W x L, PKG	64VQFN: 81 mm2: 9 x 9(VQFN)	64VQFN: 81 mm2: 9 x 9(VQFN)
Power Consumption(Typ), mW	2100	2100
Rating	Catalog	Catalog
Reference Mode	Ext,Int	Ext,Int
Resolution, Bits	16	16
SFDR, dB	98	98
SINAD, dB	79.3	79.3
SNR, dB	80.5	80.5
Sample Rate(Max), MSPS	105	105

Plan ecológico

Notas de aplicación

• Descargar
  Input Impedance Measurement Using ADC FFT Data
  PDF, 275 Kb, Archivo publicado: enero 11, 2011
  Texas Instruments has introduced a family of high-speed analog-to-digital converters (ADCs) suited tomeet the demand for high-speed and high-IF sampling systems. To achieve the highest overall system performance, an analog front-end circuit with an antialiasing filter must drive the ADC with the highestpossible dynamic range and lowest distortions. One important parameter of the front-end circ
• Descargar
  High-Speed Analog-to-Digital Converter Basics
  PDF, 1.1 Mb, Archivo publicado: enero 11, 2012
  The goal of this document is to introduce a wide range of theories and topics that are relevant tohigh-speed analog-to-digital converters (ADC). This document provides details on sampling theorydata-sheet specifications ADC selection criteria and evaluation methods clock jitter and other commonsystem-level concerns. In addition some end-users will want to extend the performance capabil
• Descargar
  QFN Layout Guidelines
  PDF, 1.3 Mb, Archivo publicado: jul 28, 2006
  Board layout and stencil information for most Texas Instruments Quad Flat No-Lead (QFN) devices is provided in their data sheets. This document helps printed-circuit board designers understand and better use this information for optimal designs.
• Descargar
  Design Considerations for Avoiding Timing Errors during High-Speed ADC, LVDS Dat (Rev. A)
  PDF, 2.0 Mb, Revisión: A, Archivo publicado: mayo 22, 2015
• Descargar
  Why Use Oversampling when Undersampling Can Do the Job? (Rev. A)
  PDF, 1.2 Mb, Revisión: A, Archivo publicado: jul 19, 2013
• Descargar
  Smart Selection of ADC/DAC Enables Better Design of Software-Defined Radio
  PDF, 376 Kb, Archivo publicado: abr 28, 2009
  This application report explains different aspects of selecting analog-to-digital and digital-to-analog data converters for Software-Defined Radio (SDR) applications. It also explains how ADS61xx ADCs and the DAC5688 from Texas Instruments fit properly for SDR designs.
• Descargar
  Driving High-Speed ADCs: Circuit Topologies and System-Level Parameters (Rev. A)
  PDF, 327 Kb, Revisión: A, Archivo publicado: sept 10, 2010
  This application report discusses the performance-related aspects of passive and active interfaces at the analog input of high-speed pipeline analog-to-digital converters (ADCs). The report simplifies the many possibilities into two main categories: passive and active interface circuits. The first section of the report gives an overview of equivalent models of buffered and unbuffered ADC input cir
• Descargar
  Phase Noise Performance and Jitter Cleaning Ability of CDCE72010
  PDF, 2.3 Mb, Archivo publicado: jun 2, 2008
  This application report presents phase noise data taken on the CDCE72010 jitter cleaner and synchronizer PLL device. The phase noise performance of the CDCE72010 depends on the phase noise of the reference clock VCXO clock and the CDCE72010 itself. This application report shows the phase noise performance at several of the most popular CDMA frequencies. This data helps the user to choose the rig
• Descargar
  CDCE72010 as a Clocking Solution for High-Speed Analog-to-Digital Converters
  PDF, 424 Kb, Archivo publicado: jun 8, 2008
  Texas Instruments has recently introduced a family of devices suitable to meet the demands of high-speed high-IF sampling analog-to-digital converters (ADCs) such as the ADS5483 which is capable of sampling up to 135 MSPS. To realize the full potential of these high-performance devices the system must provide an extremely low phase noise clock source. The CDCE72010 clock synthesizer chip offers
• Descargar
  Principles of Data Acquisition and Conversion (Rev. A)
  PDF, 132 Kb, Revisión: A, Archivo publicado: abr 16, 2015
• Descargar
  A Glossary of Analog-to-Digital Specifications and Performance Characteristics (Rev. B)
  PDF, 425 Kb, Revisión: B, Archivo publicado: oct 9, 2011
  This glossary is a collection of the definitions of Texas Instruments' Delta-Sigma (О”ОЈ), successive approximation register (SAR), and pipeline analog-to-digital (A/D) converter specifications and performance characteristics. Although there is a considerable amount of detail in this document, the product data sheet for a particular product specification is the best and final reference.
• Descargar
  Analog-to-Digital Converter Grounding Practices Affect System Performance (Rev. A)
  PDF, 69 Kb, Revisión: A, Archivo publicado: mayo 18, 2015

Linea modelo

Clasificación del fabricante

• Semiconductors> Data Converters> Analog-to-Digital Converters (ADCs)> High Speed ADCs (>10MSPS)